Homepage » Research Programmes » Advanced Nanotechnologies and Microtechnologies » Optoelectronic Characterisation of Nanostructures
aaPreskocit navigaci

Research Programmes

 

Optoelectronic Characterisation of Nanostructures

Doc. Ing. Lubomír Grmela, CSc.
Research Group Leader

THEMATIC RESEARCH FOCUS

RESEARCH AREAS

The participation of The Optoelectronic Characterisation of Nanostructure group in CEITEC will make it possible to carry out research on the local and electric and optical parameters of nanomaterials with a high resolution that is suitable for advanced semiconductor devices and materials. The laboratory contributes toward:

  • Study of major optoelectronic parameters of nanostructures, optimisation of signal-to-noise ratio and noise suppression methods
  • Experimental and theoretical research of stochastic processes and charge carrier transport
  • Development of non-destructive diagnostics and advanced methods for the estimation of the lifetime of electronic components and structures
  • Non-destructive investigation of material surfaces with transversal resolution, which is made possible by optical scanning microscopy, operating in both refl ection and transmission modes
  • The main focus is topography, local spectroscopy and fl uorescence of semiconductor surfaces as well as subsequent manufacture of probes for microscopy
  • Investigation of the method for the separate identifi cation of the contact noise and bulk noise with the aim of modifying manufacturing technology of MOSFETs and HEMT stuctures
  • Analysis of dielectric systems supplied externally and to be able to develop and manufacture dielectric nanosystems according to our own design
  • Study of dielectric relaxation in materials of interest, investigation of the microphysical mechanism of the relaxation and design of a diagnostic technique
  • Investigatation of nanostructures for biomedical purposes, industrial and security application and for the detection of biological matter
  • Analysis of micro/macroscopic systems over to the study of systems with nanoparticles
  • Exploitation of electromagnetic emission in dielectrics for the control of cracks creation and growth under mechanical load

MAIN OBJECTIVES

Investigation of the functional properties of nanostructures

Specifi cation and optimisation of the functional properties of nanostructures for nanoelectronics, nanophotonics and (bio)sensing, their correlation with geometrical/structural parameters of nanostructures and operational parameters. Novel and unique properties of nanostructures not observable in conventional materials and microstructures which open the ways for qualitatively new applications.

CONTENT OF RESEARCH

Optoelectronic Nanostructure characterisation

Research novel diagnostic methodes

The research group will deal with diagnostic methods based on noise and dielectric spectroscopy and local optical and electrical measuring. The physical background consists in the fact that charge transport and irradiation or absorption of light are of a stochastic nature and that they can be monitored and analysed using the methods of the reliability theory and mathematical statistics.

It includes a study of phenomena related to nanometric interaction of a probe and the surface of the sample, such as topography, local photoluminescence and spatial super-resolution spectroscopy. It makes use of scanning tunneling microscopes with a local probe (SNOM, SFM, STM).

The main goal is to find the correlation between the properties and the geometrical and structural parameters of nanostructures and to use this knowledge for feedback in the technology of their preparation and for various applications.

The research solution strategy is determined by the structure of the region in question, in which one can trace up to four basic distinctions. The solution nucleus is in the noise and the dielectric spectroscopy of micro- and submicro- electronic devices and materials used, in local optical nanotechnology and plasmo–chemical reactions examined.

In the research, both standard physical methods for the transport characteristics monitoring and modern statistical methods for the processes stochastic characteristics monitoring will be utilised.

Computing procedures, using an up-to-date software facility, will be developed. The dielectric and conductance characteristics of the materials under investigation at varying levels of their evolution (upon delivery from the assembly line-at different stages of manufacturing, after stabilisation and during their ageing) will be compared. Simultaneously, other characteristics variations will be examined and analyzed, such as noise, acoustic emission, IR spectra and correlations of the individual characteristic variations.

In the area of nanotechnology, the optical nanometrology laboratory will be established, which enables the measurement of local electrical and optical properties of the microelectronic and photonic structures. The physical quantities scanned at the sample surface or at the structure interface will be visualised with the spatial super-resolution, which supersedes the diffraction limit of the classical optical instruments. In–depth information about material composition will be obtained. The method of partial characteristics will represent the basic method for a theoretical model of energy radiation transport. Visible and near IR spectra measurement and analysis will be utilised for the optical diagnostics of plasmochemical processes.

The research activities are aimed at mathematical models that are described particularly in terms of mathematical structures. Their development and applicability to the solution of the nanoelectronic processes models are backed by the mathematical support group in the individual sub-areas.

KEY RESEARCH EQUIPMENT

PLANNED RESEARCH INFRASTRUCTURE

Core Facilities

The research group will be one of the principal users of the equipment available within CEITEC Nanolithography and Nanofabrication and Nanocharacterisation Core Facilities.

CURRENT RESEARCH INFRASTRUCTURE

Optical helium cryostat with closed-circuit CCS 400 – 10 to 450 K, Fiber optic kit AMPLIKIT; scanning microscope SNOM NTEGRA with AFM head; nitrogen colour adjustable laser VSL 337 ND-S; photomultiplier Hamamatsu; characteristics meter Keithley 4200; vector analyzers Agilent 4991A, 4285,4284A; spectral analyzer 35670A;

vacuum equipment – 10-7 Pa; set of precise measuring instruments for non-destructive testing and noise and dielectric measurements; set of devices for experiments EME and AE.

MAIN PROJECTS

  • Research and Development of Oxide Layers Nb2O5 a Ta2O5, contract research with AVX Czech Republic, Ltd., 2005-2011, L. Grmela, Brno University of Technology.
  • Utilizations of electromagnetics and acoustic emission in research of advanced composite materials for structural applications (GAP104/11/0734), Czech Science Foundation, 2011-2013, P. Koktavy, Brno University of Technology.
  • Electron transport, Noise and Diagnostic of Shottky and Autoemission Cathodes (GAP102/11/0995), Czech Science Foundation, 2011-2013, L. Grmela, Brno University of Technology.
  • Diagnostics of material defects using the latest defectoscopic methodes (GA102/09/H074), Czech Science Foundation, 2009-2012, K. Liedermann, Brno University of Technology.
  • Research and development progressive instruments for innovation surface quality of cast billets, bars nad wires (FR-TI2/536), Ministry of Industry and Trade, 2010-2012, R. Turoň, TŘINEC METALWORKS, Inc., D. Omacht, Material and Metallurgical Research, Ltd., L. Grmela, Brno University of Technology.
  • Application of Laser Technologies into the Process of Crystalline Sillicon Solar Cells Production (FR-TI1/305), Ministry of Industry and Trade, 2009-2013, J. Hladik, Solartec, Ltd., V. Neděla, Institute of Scientifi c Instruments AS CR, V. Lang, University of West Bohemia, P. Koktavy, Brno University of Technology.

SELECTED PUBLICATIONS

  • SKARVADA, P., GRMELA, L., TOMANEK, P.,SMITH, S., J. Microscale localization of low light emitting spots in reverse – besed Silicon solar cells. Solar Energy Material and Solar Cells. 2010, 94(11), p. 2358-2361.
  • ANDREEV, A ., GRMELA, L., MORAVEC, P., BOSMAN, G., SIKULA, J. Investigation of excess noise in CdTe single crystals. Semiconductor Science and Technology. 2010, 25(5), p. 1-7.
  • KOKTAVY, P. Experimental study of electromagnetic emission signals generated by crack generation in composite materials. Measurement Science and Technology, 2008, 20(5), p.1-7.
  • GRMELA, L., TOMANEK, P., MACKU, R. Near-fi eld measurement of ZnS:Mn nanocrystal and bulk thin -fi lm electroluminescent device. Journal of Microscopy. 2008, 229(2), p. 275-280.
  • TOMANEK, P., GRMELA, L. Local optical phenomena in InAs/GaAs heterostructures with quantum dots and artifi cial molecules. Journal of the Korean Physical Society. 2005, 47(96), p. S162-S165.