X-ray Nanodiffraction on a Single SiGe Quantum Dot inside a Functioning Field-Effect Transistor

NANO LETTERS

Hrauda, N; Zhang, JJ; Wintersberger, E; Etzelstorfer, T; Mandl, B; Stangl, J; Carbone, D; Holy, V; Jovanovic, V; Biasotto, C; Nanver, LK; Moers, J; Grutzmacher, D; Bauer, G, 2011: X-ray Nanodiffraction on a Single SiGe Quantum Dot inside a Functioning Field-Effect Transistor. NANO LETTERS 11(7), p. 2875 - 2880, doi: 10.1021/nl2013289