Determining the sub-surface damage of CdTe single crystals after lapping

Journal of Materials Science: Materials in Electronics

Šik, O.; Škvarenina, L.; Caha, O.; Moravec, P.; Škarvada, P.; Belas, E.; Grmela, L., 2018: Determining the sub-surface damage of CdTe single crystals after lapping. JOURNAL OF MATERIALS SCIENCE: MATERIALS IN ELECTRONICS 29(11), p. 9652 - 9662, doi: 10.1007/s10854-018-9002-7

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