Development of Methods for Analysis and Measuring - Petr Klapetek
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Development of Methods for Analysis and Measuring - Petr Klapetek

Equipment

CURRENT RESEARCH INFRASTRUCTURE

The methods of scanning probe microscopy (AFM, STM, MFM, EFM, SThM, NSOM) for commercial and custom devices.

Numerical simulation of distributed computing systems and supercomputers consisting of graphics cards.

Nanpositioning and Nanomeasuring machine (NMM1, Sios) for SPM, optical and tactile mesurements with single nanometer resolution up to centimeter range.