Selected publications

Publications that are part of the Web of Science database, possibly also other publications chosen by authors.

2021

• Michlicek, M; Blahova, L; Dvorakova, E; Necas, D; Zajickova, L, 2021: Deposition penetration depth and sticking probability in plasma polymerization of cyclopropylamine. APPLIED SURFACE SCIENCE 540, doi: 10.1016/j.apsusc.2020.147979

2020

• ČERNOCHOVÁ, P.; BLAHOVÁ, L.; MEDALOVÁ, J.; NEČAS, D.; MICHLÍČEK, M.; KAUSHIK, P.; PŘIBYL, J.; BARTOŠÍKOVÁ, J.; MANAKHOV, A.; BAČÁKOVÁ, L.; ZAJÍČKOVÁ, L, 2020: Cell type specific adhesion to surfaces functionalised by amine plasma polymers. SCIENTIFIC REPORTS 10(1), p. 1 - 14, doi: 10.1038/s41598-020-65889-y; FULL TEXT
• ZEMEK, M.; BLAŽEK, P.; ŠRÁMEK, J.; ŠALPLACHTA, J.; ZIKMUND, T.; KLAPETEK, P.; TAKEDA, Y.; OMOTE, K.; KAISER, J, 2020: Voxel Size Calibration for High-resolution CT. , p. 1 - 8; FULL TEXT
• Marek Zemek, Pavel Blažek, Jan Šrámek, Jakub Šalplachta, Tomáš Zikmund, Petr Klapetek, Yoshihiro Takeda, Kazuhiko Omote, Jozef Kaiser, 2020: Voxel Size Calibration for High-resolution CT. ; FULL TEXT
• Garnaes, J.; Necas, D.; Nielsen, L.; Madsen, MH.; Torras-Rosell, A.; Zeng, G.; Klapetek, P.; Yacoot, A, 2020: Algorithms for using silicon steps for scanning probe microscope evaluation. METROLOGIA 57(6), p. 064002-1 - 14, doi: 10.1088/1681-7575/ab9ad3; FULL TEXT
• ONDRAČKA, P.; NEČAS, D.; CARETTE, M.; ELISABETH, S.; HOLEC, D.; GRANIER, A.; GOULLET, A.; ZAJÍČKOVÁ, L.; RICHARD-PLOUET, M, 2020: Unravelling local environments in mixed TiO2-SiO2 thin films by XPS and ab initio calculations. APPLIED SURFACE SCIENCE 510, p. 145056-1 - 11, doi: 10.1016/j.apsusc.2019.145056; FULL TEXT
• NEČAS, D.; KLAPETEK, P.; VALTR, M, 2020: Estimation of roughness measurement bias originating from background subtraction. MEASUREMENT SCIENCE AND TECHNOLOGY 31(9), p. 094010-1 - 15, doi: 10.1088/1361-6501/ab8993; FULL TEXT
• NEČAS, D.; VALTR, M.; KLAPETEK, P, 2020: How levelling and scan line corrections ruin roughness measurement and how to prevent it. SCIENTIFIC REPORTS 10(1), p. 15294-1 - 15, doi: 10.1038/s41598-020-72171-8; FULL TEXT
• KLAPETEK, P.; YACOOT, A.; HORTVÍK, V.; DUCHOŇ, V.; DONGMO, H.; ŘEŘUCHA, Š.; VALTR, M.; NEČAS, D, 2020: Multiple-fibre interferometry setup for probe sample interaction measurements in atomic force microscopy. MEASUREMENT SCIENCE AND TECHNOLOGY 31(9), p. 094001-1 - 11, doi: 10.1088/1361-6501/ab85d8; FULL TEXT
• HEAPS, E; YACOOT, A.; DONGMO, H.; PICCO, l.; PAYTON, O.D.; RUSSEL-PAVIER, F.; KLAPETEK, P, 2020: Bringing real-time traceability to high-speed atomic force microscopy. MEASUREMENT SCIENCE AND TECHNOLOGY 31(7), p. 1 - 11, doi: 10.1088/1361-6501/ab7ca9; FULL TEXT
• Hu, X.; Dai, G.; Sievers, S.; Fernández-Scarioni, A.; Corte-León, H.; Puttock, R.; Barton, C.; Kazakova, O.; Ulvr, M.; Klapetek, P.; Havlíček, M.; Nečas, D.; Tang, Y.; Neu, V.; Schumacher, H. W., 2020: Round robin comparison on quantitative nanometer scale magnetic field measurements by magnetic force microscopy. JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS 511, p. 166947-1 - 166947-11, doi: 10.1016/j.jmmm.2020.166947

2019

• Hefny, MM; Necas, D; Zajickova, L; Benedikt, J, 2019: The transport and surface reactivity of O atoms during the atmospheric plasma etching of hydrogenated amorphous carbon films. PLASMA SOURCES SCIENCE & TECHNOLOGY 28(3), doi: 10.1088/1361-6595/ab0354
• YACOOT, A.; KLAPETEK, P.; VALTR, M.; GROLICH, P.; DONGMO, H.; LAZZERINI, M.; BRIDGES, A, 2019: Design and performance of a test rig for evaluation of nanopositioning stages. MEASUREMENT SCIENCE AND TECHNOLOGY 30(3), p. 1 - 10, doi: 10.1088/1361-6501/aafd03; FULL TEXT
• NEČAS, D.; KLAPETEK, P.; NEU, V.; HAVLÍČEK, M.; PUTTOCK, R.; KAZAKOVA, O.; HU, X.; ZAJÍČKOVÁ, L, 2019: Determination of tip transfer function for quantitative MFM using frequency domain filtering and least squares method. SCIENTIFIC REPORTS 9, p. 1 - 15, doi: 10.1038/s41598-019-40477-x; FULL TEXT
  (ICON-SPM)
• KLAPETEK, P.; CHARVÁTOVÁ CAMPBELL, A.; BURŠÍKOVÁ, V, 2019: Fast mechanical model for probe-sample elastic deformation estimation in scanning probe microscopy. ULTRAMICROSCOPY 201, p. 18 - 10, doi: 10.1016/j.ultramic.2019.03.010; FULL TEXT
• MARTINEK, J.; CHARVÁTOVÁ CAMPBELL, A.; BURŠÍKOVÁ, V.; KLAPETEK, P, 2019: Modeling the influence of roughness on nanoindentation data using finite element analysis. INTERNATIONAL JOURNAL OF MECHANICAL SCIENCES 161, p. 1 - 17, doi: 10.1016/j.ijmecsci.2019.105015; FULL TEXT
• KAUSHIK, P.; ELIÁŠ, M.; MICHALIČKA, J.; HEGEMANN, D.; PYTLÍČEK, Z.; NEČAS, D.; ZAJÍČKOVÁ, L, 2019: Atomic layer deposition of titanium dioxide on multi-walled carbon nanotubes for ammonia gas sensing. SURFACE AND COATINGS TECHNOLOGY 370, p. 235 - 9, doi: 10.1016/j.surfcoat.2019.04.031; FULL TEXT
  (ALD, EVAPORATOR, PECVD-NANOFAB, WOOLLAM-VIS, RIGAKU3, VERIOS, TITAN, KRATOS-XPS)
• BLAŽEK, P.; ŠRÁMEK, J.; ZIKMUND, T.; KALASOVÁ, D.; HORTVÍK, V.; KLAPETEK, P.; KAISER, J, 2019: Voxel size and calibration for CT measurements with a small field of view. THE E-JOURNAL OF NONDESTRUCTIVE TESTING , p. 1 - 7; FULL TEXT
• Martinek, J; Valtr, M; Hortvik, V; Grolich, P; Briand, D; Shaker, M; Klapetek, P, 2019: Large area scanning thermal microscopy and infrared imaging system. MEASUREMENT SCIENCE AND TECHNOLOGY 30(3), doi: 10.1088/1361-6501/aafa96

2018

• Ohlidal, M; Vodak, J; Necas, D, 2018: Optical Characterization of Thin Films by Means of Imaging Spectroscopic Reflectometry. OPTICAL CHARACTERIZATION OF THIN SOLID FILMS 64, p. 107 - 141, doi: 10.1007/978-3-319-75325-6_5
• Necas, D, 2018: Data Processing Methods for Imaging Spectrophotometry. OPTICAL CHARACTERIZATION OF THIN SOLID FILMS 64, p. 143 - 175, doi: 10.1007/978-3-319-75325-6_6
• Konečný, M.; Bartošík, M.; Mach, J.; Švarc, V.; Nezval, D.; Piastek, J.; Procházka, P.; Cahlík, A.; Šikola, T., 2018: Kelvin Probe Force Microscopy and Calculation of Charge Transport in a Graphene/Silicon Dioxide System at Different Relative Humidity. ACS APPL MATER INTER 10(14), p. 11987 - 11994, doi: 10.1021/acsami.7b18041
  (TERS)
• Guen, E.; Chapuis, PO.; Klapetek, P.; Puttock, R.; Hay, B.; Allard, A.; Maxwell, T.; Renahy, D.; Valtr, M.; Martinek, J.; Gomes, S. , 2018: Local Thermophysical Properties Measurements on Polymers using Doped Silicon SThM Probe: Uncertainty Analysis and Interlaboratory Comparison. , p. 1 - 6; FULL TEXT
• Manakhov, A; Fukova, S; Necas, D; Michlicek, M; Ershov, S; Elias, M; Visotin, M; Popov, Z; Zajickova, L, 2018: Analysis of epoxy functionalized layers synthesized by plasma polymerization of allyl glycidyl ether. PHYSICAL CHEMISTRY CHEMICAL PHYSICS 20(30), p. 20070 - 20077, doi: 10.1039/c8cp01452c
  (ICON-SPM, KRATOS-XPS)

2017

• Ondracka, P; Holec, D; Necas, D; Kedronova, E; Elisabeth, S; Goullet, A; Zajickova, L, 2017: Optical properties of TixSi1-xO2 solid solutions. PHYSICAL REVIEW B 95(19), doi: 10.1103/PhysRevB.95.195163
  (VUVAS, RIGAKU3)
• Zajickova, L; Jelinek, P; Obrusnik, A; Vodak, J; Necas, D, 2017: Plasma-enhanced CVD of functional coatings in Ar/maleic anhydride/C2H2 homogeneous dielectric barrier discharges at atmospheric pressure. PLASMA PHYSICS AND CONTROLLED FUSION 59(3), p. 034003-1 - 034003-13, doi: 10.1088/1361-6587/aa52e7
  (ICON-SPM)
• Vodak, J; Necas, D; Pavlinak, D; Macak, JM; Ricica, T; Jambor, R; Ohlidal, M, 2017: Application of imaging spectroscopic reflectometry for characterization of gold reduction from organometallic compound by means of plasma jet technology. APPLIED SURFACE SCIENCE 396, p. 284 - 290, doi: 10.1016/j.apsusc.2016.10.122
• Vodak, J; Necas, D; Ohlidal, M; Ohlidal, I, 2017: Determination of local thickness values of non-uniform thin films by imaging spectroscopic reflectometer with enhanced spatial resolution. MEASUREMENT SCIENCE AND TECHNOLOGY 28(2), doi: 10.1088/1361-6501/aa5534
• Ohlidal, I; Franta, D; Necas, D, 2017: Ellipsometric and reflectometric characterization of thin films exhibiting thickness non-uniformity and boundary roughness. APPLIED SURFACE SCIENCE 421, p. 687 - 696, doi: 10.1016/j.apsusc.2016.10.186
• Franta, D; Necas, D; Giglia, A; Franta, P; Ohlidal, I, 2017: Universal dispersion model for characterization of optical thin films over wide spectral range: Application to magnesium fluoride. APPLIED SURFACE SCIENCE 421, p. 424 - 429, doi: 10.1016/j.apsusc.2016.09.149
• Bannov, AG; Jasek, O; Manakhov, A; Marik, M; Necas, D; Zajickova, L, 2017: High-Performance Ammonia Gas Sensors Based on Plasma Treated Carbon Nanostructures. IEEE SENSORS JOURNAL 17(7), p. 1964 - 1970, doi: 10.1109/JSEN.2017.2656122
  (ICON-SPM)
• Bartosik, M; Kormos, L; Flajsman, L; Kalousek, R; Mach, J; Liskova, Z; Nezval, D; Svarc, V; Samoril, T; Sikola, T, 2017: Nanometer-Sized Water Bridge and Pull-Off Force in AFM at Different Relative Humidities: Reproducibility Measurement and Model Based on Surface Tension Change. JOURNAL OF PHYSICAL CHEMISTRY B 121(3), p. 610 - 619, doi: 10.1021/acs.jpcb.6b11108
  (LYRA)
• Manakhov, A; Landova, M; Medalova, J; Michlicek, M; Polcak, J; Necas, D; Zajickova, L, 2017: Cyclopropylamine plasma polymers for increased cell adhesion and growth. PLASMA PROCESSES AND POLYMERS 14(7), doi: 10.1002/ppap.201600123
  (LYRA, ICON-SPM, DEKTAK)
• Klenovsky, P; Zuda, J; Klapetek, P; Humlicek, J, 2017: Ellipsometry of surface layers on a 1-kg sphere from natural silicon. APPLIED SURFACE SCIENCE 421, p. 542 - 546, doi: 10.1016/j.apsusc.2016.08.135
  (WOOLLAM-VIS)
• Manakhov, A;, Michlicek, M; Felten, A; Pireaux, J J; Necas, D; Zajickova, L., 2017: XPS depth profiling of derivatized amine and anhydride plasma polymers: Evidence of limitations of the derivatization approach. APPLIED SURFACE SCIENCE (394), p. 578 - 585, doi: 10.1016/j.apsusc.2016.10.099
  (ICON-SPM)
• Necas, D; Klapetek, P, 2017: Study of user influence in routine SPM data processing. MEASUREMENT SCIENCE AND TECHNOLOGY 28(3), doi: 10.1088/1361-6501/28/3/034014
• CHARVÁTOVÁ CAMPBELL, A.; JELÍNEK, P.; KLAPETEK, P., 2017: Study of uncertainties of height measurements of monoatomic steps on Si 5 x 5 using DFT. MEASUREMENT SCIENCE AND TECHNOLOGY , p. 1 - 6, doi: 10.1088/1361-6501/aa5075; FULL TEXT
• Klapetek, P; Yacoot, A; Grolich, P; Valtr, M; Necas, D, 2017: Gwyscan: a library to support non-equidistant scanning probe microscope measurements. MEASUREMENT SCIENCE AND TECHNOLOGY 28(3), doi: 10.1088/1361-6501/28/3/034015
• FARKA, D.; COSKUN ALJABOUR, H.; BAUER, P.; ROTH, D.; BRUCKNER, B.; KLAPETEK, P.; SARICIFTCI, N.; STADLER, P., 2017: Increase in electron scattering length in PEDOT:PSS by a triflic acid post-processing. MONATSHEFTE FU¨R CHEMIE , p. 871 - 7, doi: 10.1007/s00706-017-1973-1; FULL TEXT
• Klapetek, P; Martinek, J; Grolich, P; Valtr, M; Kaur, NJ, 2017: Graphics cards based topography artefacts simulations in Scanning Thermal Microscopy. INTERNATIONAL JOURNAL OF HEAT AND MASS TRANSFER 108, p. 841 - 850, doi: 10.1016/j.ijheatmasstransfer.2016.12.036
• Mach, J; Prochazka, P; Bartosik, M; Nezval, D; Piastek, J; Hulva, J; Svarc, V; Konecny, M; Kormos, L; Sikola, T, 2017: Electronic transport properties of graphene doped by gallium. NANOTECHNOLOGY 28(41), doi: 10.1088/1361-6528/aa86a4
  (DIENER, DWL, EVAPORATOR, WIRE-BONDER, LYRA)

2016

• Franta, D; Necas, D; Ohlidal, I; Giglia, A, 2016: Optical characterization of SiO2 thin films using universal dispersion model over wide spectral range. OPTICAL MICRO- AND NANOMETROLOGY VI 9890, doi: 10.1117/12.2227580
• Necas, D; Ohlidal, I; Franta, D; Ohlidal, M; Vodak, J, 2016: Simultaneous determination of optical constants, local thickness and roughness of ZnSe thin films by imaging spectroscopic reflectometry. JOURNAL OF OPTICS 18(1), doi: 10.1088/2040-8978/18/1/015401
• Manakhov, A; Makhneva, E; Skladal, P; Necas, D; Cechal, J; Kalina, L; Elias, M; Zajickova, L, 2016: The robust bio-immobilization based on pulsed plasma polymerization of cyclopropylamine and glutaraldehyde coupling chemistry. APPLIED SURFACE SCIENCE 360, p. 28 - 36, doi: 10.1016/j.apsusc.2015.10.178
• Stadler, P; Farka, D; Coskun, H; Glowacki, ED; Yumusak, C; Uiberlacker, LM; Hild, S; Leonat, LN; Scharber, MC; Klapetek, P; Menon, R; Sariciftci, NS, 2016: Local order drives the metallic state in PEDOT:PSS. JOURNAL OF MATERIALS CHEMISTRY C 4(29), p. 6982 - 6987, doi: 10.1039/c6tc02129h
• Ondracka, P; Holec, D; Necas, D; Zajickova, L, 2016: Accurate prediction of band gaps and optical properties of HfO2. JOURNAL OF PHYSICS D-APPLIED PHYSICS 49(39), doi: 10.1088/0022-3727/49/39/395301

2015

• Ohlidal, M; Ohlidal, I; Necas, D; Vodak, J; Franta, D; Nadasky, P; Vizda, F, 2015: Possibilities and limitations of imaging spectroscopic reflectometry in optical characterization of thin films. OPTICAL SYSTEMS DESIGN 2015: OPTICAL FABRICATION, TESTING, AND METROLOGY V 9628, doi: 10.1117/12.2191052
• Necas, D; Ohlidal, I; Vodak, J; Ohlidal, M; Franta, D, 2015: Simultaneous determination of optical constants, local thickness, and local roughness of thin films by imaging spectroscopic reflectometry. OPTICAL SYSTEMS DESIGN 2015: OPTICAL FABRICATION, TESTING, AND METROLOGY V 9628, doi: 10.1117/12.2190091
• Necas, D; Vodak, J; Ohlidal, I; Ohlidal, M; Majumdar, A; Zajickkova, L, 2015: Simultaneous determination of dispersion model parameters and local thickness of thin films by imaging spectrophotometry. APPLIED SURFACE SCIENCE 350, p. 149 - 155, doi: 10.1016/j.apsusc.2015.01.093
• Manakhov, A; Necas, D; Cechal, J; Pavlinak, D; Elias, M; Zajickova, L, 2015: Deposition of stable amine coating onto polycaprolactone nanofibers by low pressure cyclopropylamine plasma polymerization. THIN SOLID FILMS 581, p. 7 - 13, doi: 10.1016/j.tsf.2014.09.015
• Franta, D; Necas, D; Ohlidal, I; Giglia, A, 2015: Dispersion model for optical thin films applicable in wide spectral range. OPTICAL SYSTEMS DESIGN 2015: OPTICAL FABRICATION, TESTING, AND METROLOGY V 9628, doi: 10.1117/12.2190104
• Franta, D; Necas, D; Ohlidal, I, 2015: Universal dispersion model for characterization of optical thin films over a wide spectral range: application to hafnia. APPLIED OPTICS 54(31), p. 9108 - 9119, doi: 10.1364/AO.54.009108
• Franta, D; Necas, D; Ohlidal, I; Jankuj, J, 2015: Wide spectral range characterization of antireflective coatings and their optimization. OPTICAL SYSTEMS DESIGN 2015: OPTICAL FABRICATION, TESTING, AND METROLOGY V 9628, doi: 10.1117/12.2190109
• Klapetek, P; Valtr, M; Picco, L; Payton, OD; Martinek, J; Yacoot, A; Miles, M, 2015: Large area high-speed metrology SPM system. NANOTECHNOLOGY 26(6), doi: 10.1088/0957-4484/26/6/065501
• Martinek, J; Klapetek, P; Campbell, AC, 2015: Methods for topography artifacts compensation in scanning thermal microscopy. ULTRAMICROSCOPY 155, p. 55 - 61, doi: 10.1016/j.ultramic.2015.04.011

2014

• Manakhov, A; Zajickova, L; Elias, M; Cechal, J; Polcak, J; Hnilica, J; Bittnerova, S; Necas, D, 2014: Optimization of Cyclopropylamine Plasma Polymerization toward Enhanced Layer Stability in Contact with Water. PLASMA PROCESSES AND POLYMERS 11(6), p. 532 - 544, doi: 10.1002/ppap.201300177
  (LYRA, FTIR, DEKTAK)
• Necas, D; Ohlidal, I; Franta, D; Ohlidal, M; Cudek, V; Vodak, J, 2014: Measurement of thickness distribution, optical constants, and roughness parameters of rough nonuniform ZnSe thin films. APPLIED OPTICS 53(25), p. 5606 - 5614, doi: 10.1364/AO.53.005606
• Ohlidal, I; Franta, D; Necas, D, 2014: Improved combination of scalar diffraction theory and Rayleigh-Rice theory and its application to spectroscopic ellipsometry of randomly rough surfaces. THIN SOLID FILMS 571, p. 695 - 700, doi: 10.1016/j.tsf.2014.02.092
• Necas, D; Ohlidal, I; Franta, D; Cudek, V; Ohlidal, M; Vodak, J; Sladkova, L; Zajickova, L; Elias, M; Vizd´a, F, 2014: Assessment of non-uniform thin films using spectroscopic ellipsometry and imaging spectroscopic reflectometry. THIN SOLID FILMS 571, p. 573 - 578, doi: 10.1016/j.tsf.2013.12.036
• Franta, D; Necas, D; Zajickova, L; Ohlidal, I, 2014: Broadening of dielectric response and sum rule conservation. THIN SOLID FILMS 571, p. 496 - 501, doi: 10.1016/j.tsf.2013.11.148
• Necas, D; Ohlidal, I, 2014: Consolidated series for efficient calculation of the reflection and transmission in rough multilayers. OPTICS EXPRESS 22(4), p. 4499 - 4515, doi: 10.1364/OE.22.004499
• Manakhov, A; Skladal, P; Necas, D; Cechal, J; Polcak, J; Elias, M; Zajickova, L, 2014: Cyclopropylamine plasma polymers deposited onto quartz crystal microbalance for biosensing application. PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE 211(12), p. 2801 - 2808, doi: 10.1002/pssa.201431399
  (FTIR)
• Franta, D; Necas, D; Zajickova, L; Ohlidal, I, 2014: Dispersion model of two-phonon absorption: application to c-Si. OPTICAL MATERIALS EXPRESS 4(8), p. 1641 - 1656, doi: 10.1364/OME.4.001641
• Franta, D; Necas, D; Zajickova, L; Ohlidal, I, 2014: Utilization of the sum rule for construction of advanced dispersion model of crystalline silicon containing interstitial oxygen. THIN SOLID FILMS 571, p. 490 - 495, doi: 10.1016/j.tsf.2014.03.059
• Klapetek, P; Necas, D, 2014: Independent analysis of mechanical data from atomic force microscopy. MEASUREMENT SCIENCE & TECHNOLOGY 25(4), doi: 10.1088/0957-0233/25/4/044009
• Necas, D; Cudek, V; Vodak, J; Ohlidal, M; Klapetek, P; Benedikt, J; Rugner, K; Zajickova, L, 2014: Mapping of properties of thin plasma jet films using imaging spectroscopic reflectometry. MEASUREMENT SCIENCE & TECHNOLOGY 25(11), doi: 10.1088/0957-0233/25/11/115201

2013

• Necas, D; Franta, D; Ohlidal, I; Poruba, A; Wostry, P, 2013: Ellipsometric characterization of inhomogeneous non-stoichiometric silicon nitride films. SURFACE AND INTERFACE ANALYSIS 45(7), p. 1188 - 1192, doi: 10.1002/sia.5250
• Necas, D; Klapetek, P, 2013: One-dimensional autocorrelation and power spectrum density functions of irregular regions. ULTRAMICROSCOPY 124, p. 13 - 19, doi: 10.1016/j.ultramic.2012.08.002
• Klapetek, P; Picco, L; Payton, O; Yacoot, A; Miles, M, 2013: Error mapping of high-speed AFM systems. MEASUREMENT SCIENCE & TECHNOLOGY 24(2), doi: 10.1088/0957-0233/24/2/025006
• Franta, D; Necas, D; Zajickova, L; Ohlidal, I; Stuchlik, J, 2013: Advanced modeling for optical characterization of amorphous hydrogenated silicon films. THIN SOLID FILMS 541, p. 12 - 16, doi: 10.1016/j.tsf.2013.04.129

2012

• Korotvicka, A; Necas, D; Kotora, M, 2012: Rhodium-catalyzed C-C Bond Cleavage Reactions - An Update. CURRENT ORGANIC CHEMISTRY 16(10), p. 1170 - 1214
• Fojt, L; Klapetek, P; Strasak, L; Vetterl, V, 2012: Fibrinogen and cellular adherability on differently treated titanium as implants. CENTRAL EUROPEAN JOURNAL OF PHYSICS 10(1), p. 232 - 238, doi: 10.2478/s11534-011-0080-x
• Klapetek, P; Valtr, M; Bursik, P, 2012: Non-equidistant scanning approach for millimetre-sized SPM measurements. NANOSCALE RESEARCH LETTERS 7, doi: 10.1186/1556-276X-7-213
• Klapetek, P; Valtr, M; Duchon, V; Sobota, J, 2012: Voice coil-based scanning probe microscopy. NANOSCALE RESEARCH LETTERS 7, p. 1 - 7, doi: 10.1186/1556-276X-7-332
• Lazar, J; Hrabina, J; Sery, M; Klapetek, P; Cip, O, 2012: Multiaxis interferometric displacement measurement for local probe microscopy. CENTRAL EUROPEAN JOURNAL OF PHYSICS 10(1), p. 225 - 231, doi: 10.2478/s11534-011-0093-5
• Necas, D; Klapetek, P, 2012: Gwyddion: an open-source software for SPM data analysis. CENTRAL EUROPEAN JOURNAL OF PHYSICS 10(1), p. 181 - 188, doi: 10.2478/s11534-011-0096-2
• CHARVATOVA CAMPBELL, A.;P. KLAPETEK;M. VALTR;V. BURSIKOVA., 2012: Development of reference materials for the investigation of local mechanical properties at the nanoscale. SURFACE AND INTERFACE ANALYSIS 44, p. 1151 - 1154, doi: 10.1002/sia.4850

2011

• Franta, D; Necas, D; Ohlidal, I, 2011: Anisotropy-enhanced depolarization on transparent film/substrate system. THIN SOLID FILMS 519(9), p. 2637 - 2640, doi: 10.1016/j.tsf.2010.12.113
• Franta, D; Ohlidal, I; Necas, D; Vizda, F; Caha, O; Hason, M; Pokorny, P, 2011: Optical characterization of HfO2 thin films. THIN SOLID FILMS 519(18), p. 6085 - 6091, doi: 10.1016/j.tsf.2011.03.128
• Franta, D; Necas, D; Zajickova, L; Bursikova, V; Cobet, C, 2011: Combination of synchrotron ellipsometry and table-top optical measurements for determination of band structure of DLC films. THIN SOLID FILMS 519(9), p. 2694 - 2697, doi: 10.1016/j.tsf.2010.12.059
• Zajickova, L; Franta, D; Necas, D; Bursikova, V; Muresan, M; Perina, V; Cobet, C, 2011: Dielectric response and structure of amorphous hydrogenated carbon films with nitrogen admixture. THIN SOLID FILMS 519(13), p. 4299 - 4308, doi: 10.1016/j.tsf.2011.02.021
• Necas, D; Ohlidal, I; Franta, D, 2011: Variable-angle spectroscopic ellipsometry of considerably non-uniform thin films. JOURNAL OF OPTICS 13(8), doi: 10.1088/2040-8978/13/8/085705
• Klapetek, P; Necas, D; Campbellova, A; Yacoot, A; Koenders, L, 2011: Methods for determining and processing 3D errors and uncertainties for AFM data analysis. MEASUREMENT SCIENCE & TECHNOLOGY 22(2), doi: 10.1088/0957-0233/22/2/025501
• Brand, U; Beckert, E; Beutler, A; Dai, GL; Stelzer, C; Hertwig, A; Klapetek, P; Koglin, J; Thelen, R; Tutsch, R, 2011: Comparison of optical and tactile layer thickness measurements of polymers and metals on silicon or SiO2. MEASUREMENT SCIENCE & TECHNOLOGY 22(9), doi: 10.1088/0957-0233/22/9/094021
• Bodermann, B; Buhr, E; Danzebrink, HU; Bar, M; Scholze, F; Krumrey, M; Wurm, M; Klapetek, P; Hansen, PE; Korpelainen, V; van Veghel, M; Yacoot, A; Siitonen, S; El Gawhary, O; Burger, S; Saastamoinen, T, 2011: Joint Research on Scatterometry and AFM Wafer Metrology. FRONTIERS OF CHARACTERIZATION AND METROLOGY FOR NANOELECTRONICS: 2011 1395, doi: 10.1063/1.3657910
• Ohlidal, M; Ohlidal, I; Klapetek, P; Necas, D; Majumdar, A, 2011: Measurement of the thickness distribution and optical constants of non-uniform thin films. MEASUREMENT SCIENCE & TECHNOLOGY 22(8), doi: 10.1088/0957-0233/22/8/085104
• Hrabina, J; Lazar, J; Klapetek, P; Cip, O, 2011: Multidimensional interferometric tool for the local probe microscopy nanometrology. MEASUREMENT SCIENCE & TECHNOLOGY 22(9), doi: 10.1088/0957-0233/22/9/094030
• Klapetek, P; Valtr, M; Necas, D; Salyk, O; Dzik, P, 2011: Atomic force microscopy analysis of nanoparticles in non-ideal conditions. NANOSCALE RESEARCH LETTERS 6, doi: 10.1186/1556-276X-6-514
• Klapetek, P; Valtr, M; Matula, M, 2011: A long-range scanning probe microscope for automotive reflector optical quality inspection. MEASUREMENT SCIENCE & TECHNOLOGY 22(9), doi: 10.1088/0957-0233/22/9/094011
• Hrabina, J; Lazar, J; Klapetek, P; Cip, O, 2011: AFM nanometrology interferometric system with the compensation of angle errors. OPTICAL MEASUREMENT SYSTEMS FOR INDUSTRIAL INSPECTION VII 8082, doi: 10.1117/12.889544
• Bursikova, V; Blahova, O; Karaskova, M; Zajickova, L; Jasek, O; Franta, D; Klapetek, P; Bursik, J, 2011: MECHANICAL PROPERTIES OF ULTRANANOCRYSTALLINE THIN FILMS DEPOSITED USING DUAL FREQUENCY DISCHARGES. CHEMICKE LISTY 105, p. S98 - S101
• Klapetek, P; Koenders, L, 2011: Nanoscale metrology. MEASUREMENT SCIENCE & TECHNOLOGY 22(9), doi: 10.1088/0957-0233/22/9/090101
• Campbellova, A; Ondracek, M; Pou, P; Perez, R; Klapetek, P; Jelinek, P, 2011: ´Sub-atomic´ resolution of non-contact atomic force microscope images induced by a heterogeneous tip structure: a density functional theory study. NANOTECHNOLOGY 22(29), doi: 10.1088/0957-4484/22/29/295710
• Campbellova, A; Valtr, M; Zuda, J; Klapetek, P, 2011: Traceable measurements of small forces and local mechanical properties. MEASUREMENT SCIENCE & TECHNOLOGY 22(9), doi: 10.1088/0957-0233/22/9/094007
• Campbellova, A; Klapetek, P; Valtr, M, 2011: Uncertainty modeling in nanoscale scanning probe microscopy measurements of fullerene C-60. MEASUREMENT SCIENCE & TECHNOLOGY 22(3), doi: 10.1088/0957-0233/22/3/035106

2010

• Muresan, MG; Zajickova, L; Bursikova, V; Franta, D; Necas, D, 2010: PREPARATION AND CHARACTERIZATION OF DLC:N FILMS. NANOCON 2010, 2ND INTERNATIONAL CONFERENCE , p. 434 - 440
• Lazar, J; Cip, O; Cizek, M; Hrabina, J; Sery, M; Klapetek, P, 2010: INTERFEROMETER CONTROLLED POSITIONING FOR NANOMETROLOGY. NANOCON 2010, 2ND INTERNATIONAL CONFERENCE , p. 287 - 291
• Klapetek, P; Valtr, M, 2010: Near-field optical microscopy simulations using graphics processing units. SURFACE AND INTERFACE ANALYSIS 42(41826), p. 1109 - 1113, doi: 10.1002/sia.3341
• Klapetek, P; Bujdak, J; Bursik, J, 2010: Near-field scanning optical microscopy local luminescence studies of rhodamine dye. CENTRAL EUROPEAN JOURNAL OF PHYSICS 8(3), p. 312 - 317, doi: 10.2478/s11534-009-0109-6
• Danzebrink, HU; Koenders, L; Picotto, GB; Lassila, A; Wang, SHH; Klapetek, P, 2010: Final report on EUROMET.L-S15.a (EUROMET Project 925): Intercomparison on step height standards and 1D gratings. METROLOGIA 47, doi: 10.1088/0026-1394/47/1A/04006
• Klapetek, P; Valtr, M; Poruba, A; Necas, D; Ohlidal, M, 2010: Rough surface scattering simulations using graphics cards. APPLIED SURFACE SCIENCE 256(18), p. 5640 - 5643, doi: 10.1016/j.apsusc.2010.03.028
• Campbellova, A; Klapetek, P; Bursikova, V; Valtr, M; Bursik, J, 2010: Small-load nanoindentation experiments on metals. SURFACE AND INTERFACE ANALYSIS 42(41826), p. 766 - 769, doi: 10.1002/sia.3292
• Melcher, J; Cain, M; Bounouh, A; Cuenat, A; Jacquot, A; Manninen, A; Heinonen, M; Schumacher, B; Edler, F; Rees, J; Jaegle, M; Zucca, M; Klapetek, P; Lapuh, R; Funck, T, 2010: THE EMRP PROJECT METROLOGY FOR ENERGY HARVESTING. 2010 CONFERENCE ON PRECISION ELECTROMAGNETIC MEASUREMENTS CPEM , p. 253 - 254
• Campbellova, A; Valtr, M; Klapetek, P, 2010: UNCERTAINTIES OF HARDNESS MEASUREMENTS. NANOCON 2010, 2ND INTERNATIONAL CONFERENCE , p. 278 - 281

2009

• Man, J; Klapetek, P; Man, O; Weidner, A; Obrtlik, K; Polak, J, 2009: Extrusions and intrusions in fatigued metals. Part 2. AFM and EBSD study of the early growth of extrusions and intrusions in 316L steel fatigued at room temperature. PHILOSOPHICAL MAGAZINE 89(16), p. 1337 - 1372
• Lazar, J; Klapetek, P; Cip, O; Cizek, M; Sery, M, 2009: Local probe microscopy with interferometric monitoring of the stage nanopositioning. MEASUREMENT SCIENCE & TECHNOLOGY 20(8)
• Ohlidal, M; Ohlidal, I; Klapetek, P; Necas, D; Bursikova, V, 2009: Application of spectroscopic imaging reflectometry to analysis of area non-uniformity in diamond-like carbon films. DIAMOND AND RELATED MATERIALS 18(2-3), p. 384 - 387
• Fojt, L; Klapetek, P; Strasak, L; Vetterl, V, 2009: 50 Hz magnetic field effect on the morphology of bacteria. MICRON 40(8), p. 918 - 922
• Ohlidal, M; Ohlidal, I; Klapetek, P; Necas, D, 2009: PRECISE MEASUREMENT OF THICKNESS DISTRIBUTION OF NONUNIFORM THIN FILMS BY IMAGING SPECTROSCOPIC REFLECTOMETRY. XIX IMEKO WORLD CONGRESS: FUNDAMENTAL AND APPLIED METROLOGY, PROCEEDINGS , p. 100 - 105
• Campbellova, A; Klapetek, P; Valtr, M, 2009: Tip-sample relaxation as a source of uncertainty in nanoscale scanning probe microscopy measurements. MEASUREMENT SCIENCE & TECHNOLOGY 20(8)