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High frequency noise calculation in Schottky metal-semiconductor-metal structure and parameter retrieval of nanometric CdTe structure

THIN SOLID FILMS

Elhadidy, H; Mahi, FZ; Franc, J; Musiienko, A; Dedic, V; Schneeweiss, O, 2018: High frequency noise calculation in Schottky metal-semiconductor-metal structure and parameter retrieval of nanometric CdTe structure. THIN SOLID FILMS 645, p. 340 - 344, doi: 10.1016/j.tsf.2017.10.060

Research Groups:

• Multiscale Modelling and Measurements of Physical Properties