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Large area high-speed metrology SPM system

NANOTECHNOLOGY

Klapetek, P; Valtr, M; Picco, L; Payton, OD; Martinek, J; Yacoot, A; Miles, M, 2015: Large area high-speed metrology SPM system. NANOTECHNOLOGY 26(6), doi: 10.1088/0957-4484/26/6/065501

Research Groups:

• Development of Methods for Analysis and Measuring

CEITEC authors:

• Petr Klapetek, Ph.D.