Simultaneous determination of dispersion model parameters and local thickness of thin films by imaging spectrophotometry

APPLIED SURFACE SCIENCE

Necas, D; Vodak, J; Ohlidal, I; Ohlidal, M; Majumdar, A; Zajickkova, L, 2015: Simultaneous determination of dispersion model parameters and local thickness of thin films by imaging spectrophotometry. APPLIED SURFACE SCIENCE 350, p. 149 - 155, doi: 10.1016/j.apsusc.2015.01.093

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