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Universal dispersion model for characterization of optical thin films over a wide spectral range: application to hafnia

APPLIED OPTICS

Franta, D; Necas, D; Ohlidal, I, 2015: Universal dispersion model for characterization of optical thin films over a wide spectral range: application to hafnia. APPLIED OPTICS 54(31), p. 9108 - 9119, doi: 10.1364/AO.54.009108

Research Groups:

• Development of Methods for Analysis and Measuring

CEITEC authors:

• David Nečas, Ph.D.