Dual-polarization interference microscopy for advanced quantification of phase associated with the image field

OPTICS LETTERS

BOUCHAL, P.; CHMELÍK, R.; BOUCHAL, Z., 2018: Dual-polarization interference microscopy for advanced quantification of phase associated with the image field. OPTICS LETTERS 43(3), p. 427 - 4, doi: 10.1364/OL.43.000427; FULL TEXT

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