Analysis of cut orientation through half-finished product using WEDM
Materials and Manufacturing Processes
Mouralova, K.; Benes, L.; Zahradnicek, R.; Bednar, J.; Hrabec, P.; Prokes, T., Hrdy, R., 2019: Analysis of cut orientation through half-finished product using WEDM. MATERIALS AND MANUFACTURING PROCESSES 34(1), p. 70 - 82, doi: 10.1080/10426914.2018.1544714
(HELIOS, TITAN, TEGRAMIN, LYRA)
Equipment:
- Focused Ion Beam/Scanning Electron Microscope FEI Helios NanoLab 660
- High-resolution (scanning) Transmission Electron Microscope FEI Titan Themis 60-300 cubed
- Grinder/polisher Tegramin 30
- Focused Ion Beam/Scanning Electron Microscope TESCAN LYRA3
Research Groups:
CEITEC authors: