Scanning Probe Microscope Bruker Dimension Icon (ICON-SPM)

CONTACT US

Guarantor: M.Sc. Saeed Mirzaei, Ph.D.
Technology / Methodology: Probe microscopy & Nanomanipulation
Instrument status: Operational Operational, 2.4.2020 14:50
Equipment placement: CEITEC Nano - C1.22
Research group: CF: CEITEC Nano
Upcoming trainings: 3.3. 13:30 - 16:00: ICON-SPM - Fundamentals of AFM analysis and introductory to Dimension ICON microscope.
4.3. 13:30 - 16:00: ICON-SPM_Advanced - You already granted by ICON-SPM certificate and interested in PFTUNA measurements.


Detailed description:

The Dimension Icon’s superior resolution provides the user with a significant improvement in measurement speed and quality. The Icon is the latest evolution of our industryleading, tip-scanning AFM technology, incorporating temperature-compensating position sensors to render noise levels in the sub-angstrom range for the Z-axis,
and angstroms in X-Y. This is extraordinary performance in a large-sample, 90-micron scan range system, surpassing the open-loop noise levels of highresolution AFMs. The new design of the XYZ closed-loop head also delivers higher scan speed, without loss of image quality, to enable greater throughput for data collection.


Publications:

  • Simunkova, H.; Lednický, T.; Whitehead, A.H.; Kalina, L.; Simunek, P.; Hubalek, J., 2021: Tantalum-based nanotube arrays via porous-alumina-assisted electrodeposition from ionic liquid: Formation and electrical characterization. APPLIED SURFACE SCIENCE 548, doi: 10.1016/j.apsusc.2021.149264
    (LYRA, ICON-SPM)
  • SCHÁNILEC, V.; CANALS, B.; UHLÍŘ, V.; FLAJŠMAN, L.; SADÍLEK, J.; ŠIKOLA, T.; ROUGEMAILLE, N, 2020: Bypassing Dynamical Freezing in Artificial Kagome Ice. PHYSICAL REVIEW LETTERS 125, p. 057203-1 - 5, doi: 10.1103/PhysRevLett.125.057203; FULL TEXT
    (RAITH, EVAPORATOR, VERIOS, ICON-SPM)
  • Mouralova, K.; Benes, L.; Prokes, T.; Bednar, J.; Zahradnicek, R.; Fries, J., 2020: Machining of pure molybdenum using WEDM. MEASUREMENT, JOURNAL OF THE INTERNATIONAL MEASUREMENT CONFEDERATION (IMEKO) 163, p. 108010-1 - 108010-13, doi: 10.1016/j.measurement.2020.108010
    (LYRA, TEGRAMIN, RIGAKU3, ICON-SPM)
  • Mouralova, K.; Benes, L.; Prokes, T.; Bednar, J.; Zahradnicek, R.; Jankovych, R.; Fries, J.; Vontor, J., 2020: Analysis of the machinability of copper alloy ampcoloy by WEDM. MATERIALS 13(4), p. 893-1 - 893-14, doi: 10.3390/ma13040893
    (LYRA, TEGRAMIN, ICON-SPM, HELIOS, TITAN)
  • Tesař, J., 2020: Fabrication and characterization of atomically thin layers. MASTER´S THESIS , p. 1 - 67
    (WITEC-RAMAN, MPS150, UHV-LEEM, EVAPORATOR, RAITH, ICON-SPM, WIRE-BONDER)

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