Scanning Probe Microscope Bruker Dimension Icon (ICON-SPM)

CONTACT US

Guarantor: Saeed Mirzaei, Ph.D.
Technology / Methodology: Probe microscopy & Nanomanipulation
Instrument status: Operational Operational, 2.4.2020 14:50
Equipment placement: CEITEC Nano - C1.22
Research group: CF: CEITEC Nano


Detailed description:

The Dimension Icon’s superior resolution provides the user with a significant improvement in measurement speed and quality. The Icon is the latest evolution of our industryleading, tip-scanning AFM technology, incorporating temperature-compensating position sensors to render noise levels in the sub-angstrom range for the Z-axis,
and angstroms in X-Y. This is extraordinary performance in a large-sample, 90-micron scan range system, surpassing the open-loop noise levels of highresolution AFMs. The new design of the XYZ closed-loop head also delivers higher scan speed, without loss of image quality, to enable greater throughput for data collection.


Publications:

  • Liška, J.; Ligmajer, F.; Pinho N. P. V.; Kejík, L.; Kvapil, M.; Dvořák, P.; Horký, M.; Leitner, N. S.; Reimhult, E.; Šikola, T., 2020: Effect of deposition angle on fabrication of plasmonic gold nanocones and nanodiscs. MICROELECTRONIC ENGINEERING 228, p. 111326-1 - 111326-6, doi: 10.1016/j.mee.2020.111326
    (LYRA, MIRA, EVAPORATOR, RIE-FLUORINE, ICON-SPM)
  • Mouralova, K.; Benes, L.; Prokes, T.; Bednar, J.; Zahradnicek, R.; Jankovych, R.; Fries, J.; Vontor, J., 2020: Analysis of the machinability of copper alloy ampcoloy by WEDM. MATERIALS 13(4), p. 893-1 - 893-14, doi: 10.3390/ma13040893
    (LYRA, TEGRAMIN, ICON-SPM, HELIOS, TITAN)
  • Mouralova, K.; Prokes, T.; Benes, L., 2019: Surface and Subsurface Layers Defects Analysis After WEDM Affecting the Subsequent Lifetime of Produced Components. ARABIAN JOURNAL FOR SCIENCE AND ENGINEERING 44(9), p. 7723 - 7735, doi: 10.1007/s13369-019-03887-7
    (LYRA, TEGRAMIN, ICON-SPM)
  • Vacek, P.; Kostelník, P.; Gröger, R., 2019: Correlation of Structure and EBIC Contrast from Threading Dislocations in AlN/Si Films. PHYSICA STATUS SOLIDI B 256(11), p. 1900279-1 - 1900279-7, doi: 10.1002/pssb.201900279
    (LYRA, HELIOS, ICON-SPM)
  • Mouralova, K.; Benes, L.; Prokes, T.; Zahradnicek, R.; Bednar, J.; Otoupalik, J.; Fiserova, Z.; Fiala, Z., 2019: Micro-milling machinability of pure molybdenum. THE INTERNATIONAL JOURNAL OF ADVANCED MANUFACTURING TECHNOLOGY 102(9-12), p. 4153 - 4165, doi: 10.1007/s00170-019-03524-5
    (LYRA, HELIOS, TITAN, RIGAKU9, TEGRAMIN, ICON-SPM)

Show more publications...