Scanning Probe Microscope Bruker Dimension Icon (ICON-SPM)

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Guarantor: Saeed Mirzaei, Ph.D.
Technology / Methodology: Probe microscopy & Nanomanipulation
Instrument status: Operational Operational, 2.4.2020 14:50
Equipment placement: CEITEC Nano - C1.22
Research group: CF: CEITEC Nano


Detailed description:

The Dimension Icon’s superior resolution provides the user with a significant improvement in measurement speed and quality. The Icon is the latest evolution of our industryleading, tip-scanning AFM technology, incorporating temperature-compensating position sensors to render noise levels in the sub-angstrom range for the Z-axis,
and angstroms in X-Y. This is extraordinary performance in a large-sample, 90-micron scan range system, surpassing the open-loop noise levels of highresolution AFMs. The new design of the XYZ closed-loop head also delivers higher scan speed, without loss of image quality, to enable greater throughput for data collection.


Publications:

  • Chmela, O., 2020: Progress toward the development of single nanowire-based arrays for gas sensing applications. PH.D THESIS , p. 1 - 199
    (ALD, DWL, KAUFMAN, DIENER, SUSS-MA8, SUSS-RCD8, RAITH, MAGNETRON, EVAPORATOR, RIE-FLUORINE, SCIA, DEKTAK, ICON-SPM, NANOCALC, MPS150, WIRE-BONDER)
  • Wojewoda, O.; Hula, T.; Flajšman, L.; Vaňatka, M.; Gloss, J.; Holobrádek, J.; Staňo, M.; Stienen, S.; Körber, L.; Schultheiss, K.; Schmid, M.; Schultheiss, H.; Urbánek, M., 2020: Propagation of spin waves through a Néel domain wall. APPLIED PHYSICS LETTERS 117(2), p. 022405-1 - 022405-5, doi: 10.1063/5.0013692
    (EVAPORATOR, KERR-MICROSCOPE, ICON-SPM, LYRA, BRILLOUIN, MIRA)
  • Schánilec, V.; Canals, B.; Uhlíř, V.; Flajšman, L.; Sadílek, J.; Šikola, T.; Rougemaille, N., 2020: Bypassing Dynamical Freezing in Artificial Kagome Ice. PHYSICAL REVIEW LETTERS 125, p. 057203-1 - 057203-5, doi: 10.1103/PhysRevLett.125.057203
    (RAITH, EVAPORATOR, VERIOS, ICON-SPM)
  • Mouralova, K.; Benes, L.; Prokes, T.; Bednar, J.; Zahradnicek, R.; Jankovych, R.; Fries, J.; Vontor, J., 2020: Analysis of the machinability of copper alloy ampcoloy by WEDM. MATERIALS 13(4), p. 893-1 - 893-14, doi: 10.3390/ma13040893
    (LYRA, TEGRAMIN, ICON-SPM, HELIOS, TITAN)
  • Marie, L. St; Fatimy, A. E.; Hrubý, J.; Nemec, I.; Hunt, J.; Myers-Ward, R.; Gaskill, D. K.; Kruskopf, M.; Yang, Y.; Elmquist, R.; Marx, R.; van Slageren, J.; Neugebauer, P.; Barbara, P., 2020: Nanostructured graphene for nanoscale electron paramagnetic resonance spectroscopy. JOURNAL OF PHYSICS: MATERIALS 3(1), p. 014013-1 - 014013-9, doi: 10.1088/2515-7639/ab6af8
    (ICON-SPM)

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