Scanning Probe Microscope Bruker Dimension Icon


Scanning Probe Microscope Bruker Dimension Icon

Technology / Methodology:
Probe microscopy & Nanomanipulation

Location:
CEITEC BUT

Research group:
CF: CEITEC Nano


The Dimension Icon’s superior resolution provides the user with a significant improvement in measurement speed and quality. The Icon is the latest evolution of our industryleading, tip-scanning AFM technology, incorporating temperature-compensating position sensors to render noise levels in the sub-angstrom range for the Z-axis,
and angstroms in X-Y. This is extraordinary performance in a large-sample, 90-micron scan range system, surpassing the open-loop noise levels of highresolution AFMs. The new design of the XYZ closed-loop head also delivers higher scan speed, without loss of image quality, to enable greater throughput for data collection.


Publications: