Scanning Probe Microscope Bruker Dimension Icon (ICON-SPM)

Scanning Probe Microscope Bruker Dimension Icon
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Guarantor: Igor Turčan
Technology / Methodology: Probe microscopy & Nanomanipulation
Instrument status: Operational Operational, 15.8.2018 16:30
Equipment placement: CEITEC Nano - C1.22
Research group: CF: CEITEC Nano
Upcoming trainings: 30.10. 09:00 - 12:00: AFM Basic Training - AFM Basic Training. MAX 2 attendees. Meeting point in front of the user office.


Detailed description:

The Dimension Icon’s superior resolution provides the user with a significant improvement in measurement speed and quality. The Icon is the latest evolution of our industryleading, tip-scanning AFM technology, incorporating temperature-compensating position sensors to render noise levels in the sub-angstrom range for the Z-axis,
and angstroms in X-Y. This is extraordinary performance in a large-sample, 90-micron scan range system, surpassing the open-loop noise levels of highresolution AFMs. The new design of the XYZ closed-loop head also delivers higher scan speed, without loss of image quality, to enable greater throughput for data collection.


Publications:

  • Novák, T.; Kostelník, P.; Konečný, M.; Čechal, J.; Kolíbal, M.; Šikola, T., 2019: Temperature effect on Al predose and AlN nucleation affecting the buffer layer performance for the GaN-on-Si based high-voltage devices. JAPANESE JOURNAL OF APPLIED PHYSICS 58, p. SC1018-1 - SC1018-9, doi: 10.7567/1347-4065/ab0d00
    (KRATOS-XPS, ICON-SPM)
  • Rozbořil, J., 2019: Growth and characterization of thin films of functional molecules. PH.D. THESIS , p. 1 - 115
    (RIGAKU9, ICON-SPM, TERS, NIRQUEST512)
  • Hajduček, J., 2019: Substrate-controlled nucleation of the magnetic phase transtition in nanostructures. BACHELOR´S THESIS , p. 1 - 46
    (MAGNETRON, ICON-SPM, CRYOGENIC, MIRA, RIE-FLUORINE, EVAPORATOR)
  • Kaspar, P.; Sobola, D.; Dallaev, R.; Ramazanov, S.; Nebojsa, A.; Rezaee, S.; Grmela, L., 2019: Characterization of Fe2O3 thin film on highly oriented pyrolytic graphite by AFM, Ellipsometry and XPS. APPLIED SURFACE SCIENCE 493, p. 673 - 678, doi: 10.1016/j.apsusc.2019.07.058
    (EVAPORATOR, KRATOS-XPS, WOOLLAM-VIS, ICON-SPM)
  • Vacek, P.; Kostelník, P.; Gröger, R., 2019: Correlation of Structure and EBIC Contrast from Threading Dislocations in AlN/Si Films. PHYSICA STATUS SOLIDI B , p. 1900279-1 - 1900279-7, doi: 10.1002/pssb.201900279
    (LYRA, HELIOS, ICON-SPM)

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