Scanning Probe Microscope Bruker Dimension Icon (ICON-SPM)

Scanning Probe Microscope Bruker Dimension Icon

Technology / Methodology: Probe microscopy & Nanomanipulation
Instrument status: Operational Operational, 15.8.2018 16:30
Equipment placement: CEITEC Nano - C1.22
Research group: CF: CEITEC Nano

Detailed description:

The Dimension Icon’s superior resolution provides the user with a significant improvement in measurement speed and quality. The Icon is the latest evolution of our industryleading, tip-scanning AFM technology, incorporating temperature-compensating position sensors to render noise levels in the sub-angstrom range for the Z-axis,
and angstroms in X-Y. This is extraordinary performance in a large-sample, 90-micron scan range system, surpassing the open-loop noise levels of highresolution AFMs. The new design of the XYZ closed-loop head also delivers higher scan speed, without loss of image quality, to enable greater throughput for data collection.


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