Scanning Probe Microscope Bruker Dimension Icon (ICON-SPM)

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Guarantor: Saeed Mirzaei, Ph.D.
Technology / Methodology: Probe microscopy & Nanomanipulation
Instrument status: Operational Operational, 2.4.2020 14:50
Equipment placement: CEITEC Nano - C1.22
Research group: CF: CEITEC Nano


Detailed description:

The Dimension Icon’s superior resolution provides the user with a significant improvement in measurement speed and quality. The Icon is the latest evolution of our industryleading, tip-scanning AFM technology, incorporating temperature-compensating position sensors to render noise levels in the sub-angstrom range for the Z-axis,
and angstroms in X-Y. This is extraordinary performance in a large-sample, 90-micron scan range system, surpassing the open-loop noise levels of highresolution AFMs. The new design of the XYZ closed-loop head also delivers higher scan speed, without loss of image quality, to enable greater throughput for data collection.


Publications:

  • Liška, J.; Ligmajer, F.; Pinho N. P. V.; Kejík, L.; Kvapil, M.; Dvořák, P.; Horký, M.; Leitner, N. S.; Reimhult, E.; Šikola, T., 2020: Effect of deposition angle on fabrication of plasmonic gold nanocones and nanodiscs. MICROELECTRONIC ENGINEERING 228, p. 111326-1 - 111326-6, doi: 10.1016/j.mee.2020.111326
    (LYRA, MIRA, EVAPORATOR, RIE-FLUORINE, ICON-SPM)
  • Chmela, O., 2020: Progress toward the development of single nanowire-based arrays for gas sensing applications. PH.D THESIS , p. 1 - 199
    (ALD, DWL, KAUFMAN, DIENER, SUSS-MA8, SUSS-RCD8, RAITH, MAGNETRON, EVAPORATOR, RIE-FLUORINE, SCIA, DEKTAK, ICON-SPM, NANOCALC, MPS150, WIRE-BONDER)
  • Mouralova, K.; Benes, L.; Prokes, T.; Bednar, J.; Zahradnicek, R.; Jankovych, R.; Fries, J.; Vontor, J., 2020: Analysis of the machinability of copper alloy ampcoloy by WEDM. MATERIALS 13(4), p. 893-1 - 893-14, doi: 10.3390/ma13040893
    (LYRA, TEGRAMIN, ICON-SPM, HELIOS, TITAN)
  • Fecko, P., 2019: Gecko mimicking surfaces. MASTER´S THESIS , p. 1 - 52
    (SUSS-RCD8, SUSS-MA8, DWL, DRIE, LYRA, ALD, RIE-FLUORINE, ICON-SPM)
  • Hrubý, J.; Santana, V. T.; Kostiuk, D.; Bouček, M.; Lenz, S.; Kern, M.; Šiffalovič, P.; van Slageren, J.; Neugebauer, P., 2019: A graphene-based hybrid material with quantum bits prepared by the double Langmuir–Schaefer method. RSC ADVANCES 9(42), p. 24066 - 24073, doi: 10.1039/c9ra04537f
    (KRATOS-XPS, VERIOS, ICON-SPM)

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