Ultramicrotome Leica EM UC7 for samples preparation for Electron Microscopy and AFM


Ultramicrotome Leica EM UC7 for samples preparation for Electron Microscopy and AFM

Location:
CEITEC BUT

Research group:
Advanced Polymers and Composites - Josef Jančář


Ultramicrotome Leica EM UC7 for samples preparation for Electron Microscopy and AFM

Description

• Equipment for preparation of ultrathin sections intended for the observation using light microscopy (LM), electron microscopy (SEM, TEM) and atomic force microscopy (AFM).

Applications

• Preparation of samples with thickness up to 100nm at room temperature
• Cutting samples using gravitation forces (non-motor slicing)