X-ray Photoelectron Spectroscopy Kratos Analytical Axis Supra (KRATOS-XPS)

CONTACT US

Guarantor: Josef Polčák, Ph.D.
Instrument status: Some Issues Some Issues, 11.10.2019 09:59, Instrument is again operational after X-ray filament change. Charge neutraliser lower efficiency. Spare part (charge balance plate) ordered.
Equipment placement: CEITEC Nano - C1.38
Research group: CF: CEITEC Nano


Detailed description:

AXIS SupraTM is an X-ray photoelectron spectrometer (XPS) with unrivalled automation and ease of use for materials surface characterisation. The patented AXIS technology ensures high electron collection efficiency in spectroscopy mode and low aberrations at high magnifications in parallel imaging mode.
X-ray photoelectron spectroscopy (XPS) provides information on elemental composition and chemical bonding states of materials, Ultraviolet photoelectron spectroscopy (UPS) provides information on valence levels and work function measurements of materials, Low energy Ion Scattering spectroscopy (ISS) provides evaluation of the elemental composition and structure of solid surfaces. XPS mode is also capable of surface mapping to provide lateral distribution maps of elemental and chemical species at the surface.
The system is also equipped by Argon cluster ion source for sample cleaning or depth profiling.
Preparation chamber connected to the analysis chamber offers sample treatment in gas reaction chamber or deposition by effusion cell and afterwards in-situ analysis.


Publications:

  • Kaspar, P.; Sobola, D.; Dallaev, R.; Ramazanov, S.; Nebojsa, A.; Rezaee, S.; Grmela, L., 2019: Characterization of Fe2O3 thin film on highly oriented pyrolytic graphite by AFM, Ellipsometry and XPS. APPLIED SURFACE SCIENCE 493, p. 673 - 678, doi: 10.1016/j.apsusc.2019.07.058
    (EVAPORATOR, KRATOS-XPS, WOOLLAM-VIS, ICON-SPM)
  • Kovařík, M., 2019: Characterization of electronic properties of nanowires for electrochemistry. MASTER´S THESIS , p. 1 - 60
    (KRATOS-XPS, ICON-SPM)
  • Ponomarev, V. A.; Sheveyko, A. N.; Sukhorukova, I. V.; Shvindina, N. V.; Manakhov, A. M.; Zhitnyak, I. Y.; Gloushankova, N. A.; Fursova, N. K.; Ignatov, S. G.; Permyakova, E. S.; Polcak, J.; Shtansky, D. V., 2019: Microstructure, chemical and biological performance of boron-modified TiCaPCON films. APPLIED SURFACE SCIENCE 465, p. 486 - 497, doi: 10.1016/j.apsusc.2018.09.157
    (KRATOS-XPS)
  • Michlíček, M.; Manakhov, A.; Dvořáková, E.; Zajíčková, L., 2019: Homogeneity and penetration depth of atmospheric pressure plasma polymerization onto electrospun nanofibrous mats. APPLIED SURFACE SCIENCE 471, p. 835 - 841, doi: 10.1016/j.apsusc.2018.11.148
    (LYRA, MAGNETRON, FTIR, KRATOS-XPS)
  • Novák, T.; Kostelník, P.; Konečný, M.; Čechal, J.; Kolíbal, M.; Šikola, T., 2019: Temperature effect on Al predose and AlN nucleation affecting the buffer layer performance for the GaN-on-Si based high-voltage devices. JAPANESE JOURNAL OF APPLIED PHYSICS 58, p. SC1018-1 - SC1018-9, doi: 10.7567/1347-4065/ab0d00
    (KRATOS-XPS, ICON-SPM)

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