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Optical Characterization Of Thin Films by Means of Imaging Spectroscopic Reflectometry
OPTICAL CHARACTERIZATION OF THIN SOLID FILMS
OHLÍDAL, M.; VODÁK, J.; NEČAS, D., 2018: Optical Characterization Of Thin Films by Means of Imaging Spectroscopic Reflectometry. OPTICAL CHARACTERIZATION OF THIN SOLID FILMS 64, p. 107 - 34, doi: 10.1007/978-3-319-75325-6_5; FULL TEXT
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