Research Research Areas Research Groups Selected Publications Selected Projects Open Science
Laboratories Core Facilities Booking system RICAIP Testbed Brno Industry Cooperation
Education PhD School Postdoc Programme Seminar Series Summer School Internships Secondary Teachers
Career Training Jobs MSCA–PF HRS4R Award Alumni Network Welcome Office Innovation Accelerator
About Us News Events People Organisational Structure Scientific Evaluation To Download Press and Media Contacts
CZ
Home Research Selected Publications Optical functions of silicon from reflectance and ellipsometry on silicon-on-insulator and homoepitaxial samples
Share Share Share

Optical functions of silicon from reflectance and ellipsometry on silicon-on-insulator and homoepitaxial samples

JOURNAL OF APPLIED PHYSICS

Humlicek, J; Sik, J, 2015: Optical functions of silicon from reflectance and ellipsometry on silicon-on-insulator and homoepitaxial samples. JOURNAL OF APPLIED PHYSICS 118(19), doi: 10.1063/1.4936126