Ultra High Vacuum Preparation and Analytical System - Low Energy Ion Spectroscopy ION-TOF Qtac 100 (UHV-LEIS)

CONTACT US

Guarantor: Marek Otevřel, Ph.D.
Instrument status: Operational Operational, 9.2.2018 17:09
Equipment placement: CEITEC Nano - C1.38
Research group: CF: CEITEC Nano


Detailed description:

Ultra High Vacuum Preparation and Analytical System - Low Energy Ion Spectroscopy ION-TOF Qtac 100


Publications:

  • Uhlíř, V.; Pressacco, F.; Arregi, J. A.; Procházka, P.; Průša, S.; Potoček, M.; Šikola, T.; Čechal, J.; Bendounan, A.; Sirotti, F., 2020: Single-layer graphene on epitaxial FeRh thin films. APPLIED SURFACE SCIENCE 514, p. 145923-1 - 145923-7, doi: 10.1016/j.apsusc.2020.145923
    (MAGNETRON, VERSALAB, RIGAKU9, UHV-LEEM, UHV-LEIS, UHV-SPM, UHV-PREPARATION, UHV-XPS, SIMS)
  • Fikáček, J.; Procházka, P.; Stetsovych, V.; Průša, S.; Vondráček, M.; Kormoš, L.; Skála, T.; Vlaic, P.; Caha, O.; Carva, K.; Čechal, J.; Springholz, G.; Honolka, J., 2020: Step-edge assisted large scale FeSe monolayer growth on epitaxial Bi_2 Se_3 thin films. NEW JOURNAL OF PHYSICS 22(7), p. 073050-1 - 073050-12, doi: 10.1088/1367-2630/ab9b59
    (UHV-LEEM, UHV-XPS, UHV-LEIS, UHV-DEPOSITION, UHV-PREPARATION)
  • Prajzler, V.; Prusa, S.; Maca, K., 2019: Rapid pressure-less sintering of fine grained zirconia ceramics: Explanation and elimination of a core-shell structure. JOURNAL OF THE EUROPEAN CERAMIC SOCIETY 39(16), p. 5309 - 5319, doi: 10.1016/j.jeurceramsoc.2019.07.053
    (VERIOS, UHV-LEIS)
  • Šik, O.; Bábor, P.; Polčák, J.; Belas, E.; Moravec, P.; Grmela, L.; Staněk, J., 2018: Low energy ion scattering as a depth profiling tool for thin layers - Case of bromine methanol etched CdTe. VACUUM 152, p. 138 - 144, doi: 10.1016/j.vacuum.2018.03.014
    (UHV-LEIS, KRATOS-XPS)
  • Bábík, P., 2018: Charge exchange processes involved in projectile-target interaction at low energy range studied by HS-LEIS. MASTER´S THESIS , p. 1 - 55
    (UHV-LEIS)

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