Advanced Course on XPS Data Analysis and Interpretation

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About event

Learn how to analyze and interpret your XPS data correctly with XPS Masters.

While the development of X-ray photoelectron spectroscopy instruments has led to their accessibility and ease of data collection, the analysis and interpretation of measured data remain challenging. In recent years, the share of incorrect analyses in the scientific literature has reached 60%, according to a recent survey, while an XPS expert recognizes flaws at a glance. The primary reason is the lack of proper education; to remedy this situation, we introduce a 2-day advanced course designed to provide the necessary core knowledge on the XPS technique, data analysis, and interpretation.

About the lecturer

Jan Čechal is a professor of applied physics and leader of the research group Molecular Nanostructures at Surfaces at CEITEC, Brno University of Technology. He has 25 years of experience in surface analysis, particularly XPS, including synchrotron radiation measurements. He made a significant contribution to establishing the XPS in the CEITEC Nano Core Facility. He is a coauthor of two perspective/guidelines papers on XPS: 

• Perspective on improving the quality of surface and material data analysis in the scientific literature with a focus on X-ray Photoelectron Spectroscopy (XPS) by Major et al., J. Vac. Sci. Technol. A 41 (2023), 038501; and  
• Avoiding Common Errors in X-ray Photoelectron Spectroscopy Data Collection and Analysis, and Properly Reporting Instrument Parameters by Pinder et al., Appl. Surf. Sci. Adv. 19 (2024), 100534. 

The course fee

• Introductory price: 5000 CZK (200€)/participant

(Regular fee 400 €/participant is reduced to 200 €/participant for the courses held from December to February).

What is included

• Course materials and slides from presentations.
• Coffee breaks and lunch. 
• Certificate of attendance. 
• Voucher for a 30-minute individual consultation worth 100€. 

What to bring

• Your own computer for tutorials.

Programme

The course presents a balanced mix of lectures (L) and hands-on tutorials (T) on the analysis of the provided data.

Day 1: 

L1: Introduction to XPS and overview of core knowledge (1 hour)

L2: Principles of XPS and anatomy of the spectrum (2 hours)

• T1: Reading the spectra (1.5 hours)

L3: Going deep in the core level shifts (1.5 hours)

• T2: Peak Fitting (2 hours)

Day 2:

• T2: Peak Fitting (continuing, 1.5 hours)

L4: Quantitative analysis (1 hour)

• T3: Quantification (1 hour)

L5: Electron transport in solids and depth profiling (1.5 hours)

• T4: Layer thickness determination, SESSA (1 hour)

L6: Instrumentation charge compensation and referencing (1 hour)

• T5: Charge referencing, spotting inconsistencies in the spectra (1 hour)