Atomic force microscope JPK Nanowizzard (JPK-NANOWIZARD)
Petr Lepcio, Ph.D.
Instrument status: Operational, 6.3.2020 14:49, Moved to Optical Laboratory (Nanocharacterization)
Equipment placement: CEITEC Nano - C1.21
Research group: CF: CEITEC Nano
AFM module allows for nanoscale surface microscopy with atomic resolution of a sample observed with CLSM. It is based on attractive and repulsive forces between surface of the sample (atoms at the surface) and a probe with a fine tip mounted on a flexible cantilever which scans across the surface. The forces are converted into bending or deflection of the cantilever which is detected by laser beam reflected from the back side of the cantilever into detector. Both conductive and insulating, solid and liquid samples can be visualized by AFM into a real 3D detail of surface. AFM module shifts performance of CLSM above the resolution capability of SEM (AFM resolution is < 1 nm in case of ideal samples and very fine tips) without the need of surface metal coating which covers up details at scale from one to tens of nanometers.