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Estimation of roughness measurement bias originating from background subtraction

MEASUREMENT SCIENCE AND TECHNOLOGY

NEČAS, D.; KLAPETEK, P.; VALTR, M., 2020: Estimation of roughness measurement bias originating from background subtraction. MEASUREMENT SCIENCE AND TECHNOLOGY 31(9), p. 094010-1 - 15, doi: 10.1088/1361-6501/ab8993; FULL TEXT

CEITEC authors:

• Petr Klapetek, Ph.D.
• Miroslav Valtr, Ph.D.
• David Nečas, Ph.D.