Petr Klapetek, Ph.D.

2017

• Klapetek, P; Yacoot, A; Grolich, P; Valtr, M; Necas, D, 2017: Gwyscan: a library to support non-equidistant scanning probe microscope measurements. MEASUREMENT SCIENCE AND TECHNOLOGY 28(3), doi: 10.1088/1361-6501/28/3/034015
• Klapetek, P; Martinek, J; Grolich, P; Valtr, M; Kaur, NJ, 2017: Graphics cards based topography artefacts simulations in Scanning Thermal Microscopy. INTERNATIONAL JOURNAL OF HEAT AND MASS TRANSFER 108, p. 841 - 850, doi: 10.1016/j.ijheatmasstransfer.2016.12.036
• Klenovsky, P; Zuda, J; Klapetek, P; Humlicek, J, 2017: Ellipsometry of surface layers on a 1-kg sphere from natural silicon. APPLIED SURFACE SCIENCE 421, p. 542 - 546, doi: 10.1016/j.apsusc.2016.08.135 (WOOLLAM-VIS)

2016

• Stadler, P; Farka, D; Coskun, H; Glowacki, ED; Yumusak, C; Uiberlacker, LM; Hild, S; Leonat, LN; Scharber, MC; Klapetek, P; Menon, R; Sariciftci, NS, 2016: Local order drives the metallic state in PEDOT:PSS. JOURNAL OF MATERIALS CHEMISTRY C 4(29), p. 6982 - 6987, doi: 10.1039/c6tc02129h

2015

• Klapetek, P; Valtr, M; Picco, L; Payton, OD; Martinek, J; Yacoot, A; Miles, M, 2015: Large area high-speed metrology SPM system. NANOTECHNOLOGY 26(6), doi: 10.1088/0957-4484/26/6/065501
• Martinek, J; Klapetek, P; Campbell, AC, 2015: Methods for topography artifacts compensation in scanning thermal microscopy. ULTRAMICROSCOPY 155, p. 55 - 61, doi: 10.1016/j.ultramic.2015.04.011

2014

• Klapetek, P; Necas, D, 2014: Independent analysis of mechanical data from atomic force microscopy. MEASUREMENT SCIENCE & TECHNOLOGY 25(4), doi: 10.1088/0957-0233/25/4/044009
• Necas, D; Cudek, V; Vodak, J; Ohlidal, M; Klapetek, P; Benedikt, J; Rugner, K; Zajickova, L, 2014: Mapping of properties of thin plasma jet films using imaging spectroscopic reflectometry. MEASUREMENT SCIENCE & TECHNOLOGY 25(11), doi: 10.1088/0957-0233/25/11/115201

2013

• Necas, D; Klapetek, P, 2013: One-dimensional autocorrelation and power spectrum density functions of irregular regions. ULTRAMICROSCOPY 124, p. 13 - 19, doi: 10.1016/j.ultramic.2012.08.002
• Klapetek, P; Picco, L; Payton, O; Yacoot, A; Miles, M, 2013: Error mapping of high-speed AFM systems. MEASUREMENT SCIENCE & TECHNOLOGY 24(2), doi: 10.1088/0957-0233/24/2/025006

2012

• Necas, D; Klapetek, P, 2012: Gwyddion: an open-source software for SPM data analysis. CENTRAL EUROPEAN JOURNAL OF PHYSICS 10(1), p. 181 - 188, doi: 10.2478/s11534-011-0096-2
• CHARVATOVA CAMPBELL, A.;P. KLAPETEK;M. VALTR;V. BURSIKOVA., 2012: Development of reference materials for the investigation of local mechanical properties at the nanoscale. SURFACE AND INTERFACE ANALYSIS 44, p. 1151 - 1154, doi: 10.1002/sia.4850
• Klapetek, P; Valtr, M; Duchon, V; Sobota, J, 2012: Voice coil-based scanning probe microscopy. NANOSCALE RESEARCH LETTERS 7, p. 1 - 7, doi: 10.1186/1556-276X-7-332
• Klapetek, P; Valtr, M; Bursik, P, 2012: Non-equidistant scanning approach for millimetre-sized SPM measurements. NANOSCALE RESEARCH LETTERS 7, doi: 10.1186/1556-276X-7-213
• Lazar, J; Hrabina, J; Sery, M; Klapetek, P; Cip, O, 2012: Multiaxis interferometric displacement measurement for local probe microscopy. CENTRAL EUROPEAN JOURNAL OF PHYSICS 10(1), p. 225 - 231, doi: 10.2478/s11534-011-0093-5
• Fojt, L; Klapetek, P; Strasak, L; Vetterl, V, 2012: Fibrinogen and cellular adherability on differently treated titanium as implants. CENTRAL EUROPEAN JOURNAL OF PHYSICS 10(1), p. 232 - 238, doi: 10.2478/s11534-011-0080-x

2011

• Hrabina, J; Lazar, J; Klapetek, P; Cip, O, 2011: Multidimensional interferometric tool for the local probe microscopy nanometrology. MEASUREMENT SCIENCE & TECHNOLOGY 22(9), doi: 10.1088/0957-0233/22/9/094030
• Klapetek, P; Necas, D; Campbellova, A; Yacoot, A; Koenders, L, 2011: Methods for determining and processing 3D errors and uncertainties for AFM data analysis. MEASUREMENT SCIENCE & TECHNOLOGY 22(2), doi: 10.1088/0957-0233/22/2/025501
• Ohlidal, M; Ohlidal, I; Klapetek, P; Necas, D; Majumdar, A, 2011: Measurement of the thickness distribution and optical constants of non-uniform thin films. MEASUREMENT SCIENCE & TECHNOLOGY 22(8), doi: 10.1088/0957-0233/22/8/085104
• Bodermann, B; Buhr, E; Danzebrink, HU; Bar, M; Scholze, F; Krumrey, M; Wurm, M; Klapetek, P; Hansen, PE; Korpelainen, V; van Veghel, M; Yacoot, A; Siitonen, S; El Gawhary, O; Burger, S; Saastamoinen, T, 2011: Joint Research on Scatterometry and AFM Wafer Metrology. FRONTIERS OF CHARACTERIZATION AND METROLOGY FOR NANOELECTRONICS: 2011 1395, doi: 10.1063/1.3657910
• Campbellova, A; Klapetek, P; Valtr, M, 2011: Uncertainty modeling in nanoscale scanning probe microscopy measurements of fullerene C-60. MEASUREMENT SCIENCE & TECHNOLOGY 22(3), doi: 10.1088/0957-0233/22/3/035106
• Campbellova, A; Valtr, M; Zuda, J; Klapetek, P, 2011: Traceable measurements of small forces and local mechanical properties. MEASUREMENT SCIENCE & TECHNOLOGY 22(9), doi: 10.1088/0957-0233/22/9/094007
• Campbellova, A; Ondracek, M; Pou, P; Perez, R; Klapetek, P; Jelinek, P, 2011: ´Sub-atomic´ resolution of non-contact atomic force microscope images induced by a heterogeneous tip structure: a density functional theory study. NANOTECHNOLOGY 22(29), doi: 10.1088/0957-4484/22/29/295710
• Klapetek, P; Koenders, L, 2011: Nanoscale metrology. MEASUREMENT SCIENCE & TECHNOLOGY 22(9), doi: 10.1088/0957-0233/22/9/090101
• Bursikova, V; Blahova, O; Karaskova, M; Zajickova, L; Jasek, O; Franta, D; Klapetek, P; Bursik, J, 2011: MECHANICAL PROPERTIES OF ULTRANANOCRYSTALLINE THIN FILMS DEPOSITED USING DUAL FREQUENCY DISCHARGES. CHEMICKE LISTY 105, p. S98 - S101
• Brand, U; Beckert, E; Beutler, A; Dai, GL; Stelzer, C; Hertwig, A; Klapetek, P; Koglin, J; Thelen, R; Tutsch, R, 2011: Comparison of optical and tactile layer thickness measurements of polymers and metals on silicon or SiO2. MEASUREMENT SCIENCE & TECHNOLOGY 22(9), doi: 10.1088/0957-0233/22/9/094021
• Klapetek, P; Valtr, M; Necas, D; Salyk, O; Dzik, P, 2011: Atomic force microscopy analysis of nanoparticles in non-ideal conditions. NANOSCALE RESEARCH LETTERS 6, doi: 10.1186/1556-276X-6-514
• Hrabina, J; Lazar, J; Klapetek, P; Cip, O, 2011: AFM nanometrology interferometric system with the compensation of angle errors. OPTICAL MEASUREMENT SYSTEMS FOR INDUSTRIAL INSPECTION VII 8082, doi: 10.1117/12.889544
• Klapetek, P; Valtr, M; Matula, M, 2011: A long-range scanning probe microscope for automotive reflector optical quality inspection. MEASUREMENT SCIENCE & TECHNOLOGY 22(9), doi: 10.1088/0957-0233/22/9/094011

2010

• Klapetek, P; Bujdak, J; Bursik, J, 2010: Near-field scanning optical microscopy local luminescence studies of rhodamine dye. CENTRAL EUROPEAN JOURNAL OF PHYSICS 8(3), p. 312 - 317, doi: 10.2478/s11534-009-0109-6
• Klapetek, P; Valtr, M, 2010: Near-field optical microscopy simulations using graphics processing units. SURFACE AND INTERFACE ANALYSIS 42(41826), p. 1109 - 1113, doi: 10.1002/sia.3341
• Lazar, J; Cip, O; Cizek, M; Hrabina, J; Sery, M; Klapetek, P, 2010: INTERFEROMETER CONTROLLED POSITIONING FOR NANOMETROLOGY. NANOCON 2010, 2ND INTERNATIONAL CONFERENCE , p. 287 - 291
• Klapetek, P; Valtr, M; Poruba, A; Necas, D; Ohlidal, M, 2010: Rough surface scattering simulations using graphics cards. APPLIED SURFACE SCIENCE 256(18), p. 5640 - 5643, doi: 10.1016/j.apsusc.2010.03.028
• Campbellova, A; Valtr, M; Klapetek, P, 2010: UNCERTAINTIES OF HARDNESS MEASUREMENTS. NANOCON 2010, 2ND INTERNATIONAL CONFERENCE , p. 278 - 281
• Melcher, J; Cain, M; Bounouh, A; Cuenat, A; Jacquot, A; Manninen, A; Heinonen, M; Schumacher, B; Edler, F; Rees, J; Jaegle, M; Zucca, M; Klapetek, P; Lapuh, R; Funck, T, 2010: THE EMRP PROJECT METROLOGY FOR ENERGY HARVESTING. 2010 CONFERENCE ON PRECISION ELECTROMAGNETIC MEASUREMENTS CPEM , p. 253 - 254
• Campbellova, A; Klapetek, P; Bursikova, V; Valtr, M; Bursik, J, 2010: Small-load nanoindentation experiments on metals. SURFACE AND INTERFACE ANALYSIS 42(41826), p. 766 - 769, doi: 10.1002/sia.3292
• Danzebrink, HU; Koenders, L; Picotto, GB; Lassila, A; Wang, SHH; Klapetek, P, 2010: Final report on EUROMET.L-S15.a (EUROMET Project 925): Intercomparison on step height standards and 1D gratings. METROLOGIA 47, doi: 10.1088/0026-1394/47/1A/04006

2009

• Lazar, J; Klapetek, P; Cip, O; Cizek, M; Sery, M, 2009: Local probe microscopy with interferometric monitoring of the stage nanopositioning. MEASUREMENT SCIENCE & TECHNOLOGY 20(8)
• Ohlidal, M; Ohlidal, I; Klapetek, P; Necas, D, 2009: PRECISE MEASUREMENT OF THICKNESS DISTRIBUTION OF NONUNIFORM THIN FILMS BY IMAGING SPECTROSCOPIC REFLECTOMETRY. XIX IMEKO WORLD CONGRESS: FUNDAMENTAL AND APPLIED METROLOGY, PROCEEDINGS , p. 100 - 105
• Campbellova, A; Klapetek, P; Valtr, M, 2009: Tip-sample relaxation as a source of uncertainty in nanoscale scanning probe microscopy measurements. MEASUREMENT SCIENCE & TECHNOLOGY 20(8)
• Man, J; Klapetek, P; Man, O; Weidner, A; Obrtlik, K; Polak, J, 2009: Extrusions and intrusions in fatigued metals. Part 2. AFM and EBSD study of the early growth of extrusions and intrusions in 316L steel fatigued at room temperature. PHILOSOPHICAL MAGAZINE 89(16), p. 1337 - 1372
• Fojt, L; Klapetek, P; Strasak, L; Vetterl, V, 2009: 50 Hz magnetic field effect on the morphology of bacteria. MICRON 40(8), p. 918 - 922
• Ohlidal, M; Ohlidal, I; Klapetek, P; Necas, D; Bursikova, V, 2009: Application of spectroscopic imaging reflectometry to analysis of area non-uniformity in diamond-like carbon films. DIAMOND AND RELATED MATERIALS 18(2-3), p. 384 - 387

• Research and development of new technologies for the production of a bipolar transistor with insulated gate (TIGBT) (TH01010419), EPSILON, 2015 - 2017
• Deposition of thermomechanically stable nanostructured diamond-like thin films in dual frequency capacitive discharges (GA202/07/1669), Czech Science Foundation - Standard Grants, 2007 - 2011
• Nanometrology using methods of scanning probe microscopy (KAN311610701), Academy of Sciences of the Czech Republic - Nanotechnologies for Society, 2007 - 2011
• Analysis of the optical properties of solar cells (FT-TA3/142), Ministry of Industry and Trade - TANDEM, 2006 - 2009