Focused Ion Beam/Scanning Electron Microscope FEI Helios NanoLab 660 (HELIOS)

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Guarantor: Ondřej Man, Ph.D.
Instrument status: Operational Operational, 29.5.2026 20:00
Equipment placement: CEITEC Nano - A1.10
Research group: CF: CEITEC Nano


Description:

FEG-type scanning electron microscope with High/Low vacuum regime with resolution at least 1,5 nm @ 15 kV (in high vacuum mode) and with chamber allowing XY stage travel at least 100x100 mm. Equipped with analytical attachments EDS + WDS + EBSD.


Publications:

  • KRAL, J.; DECKA, K.; LIŠKA, P.; TORRES, S.; VALENTA, J.; BABIN, V.; MONZON, I.; CUBA, V.; MIHOKOVA, E.; AUFFRAY, E., 2026: Tailored thermally stable functionalization of CsPbBr3 nanocrystals for polymer nanocomposite scintillator fabrication. JOURNAL OF MATERIALS CHEMISTRY C , doi: 10.1039/d5tc03614c; FULL TEXT
    (HELIOS, LVEM)
  • Odehnal, L.; Ranuša, M.; Čípek, P.; Malý, M.; Mazánová, V.; Dlouhý, A.; Koutný, D.; Hartl, M.; Vrbka, M., 2026: . TRIBOLOGY INTERNATIONAL 216, doi: 10.1016/j.triboint.2025.111599; FULL TEXT
    (HELIOS)
  • Daghbouj, N.; Tamer AlMotasem, A.; Li, B.; Krsjak, V.; Duchoň, J.; Ge, F.; Liedke, M. O.; Wagner, A.; Bensalem, M.; Bahadur, F.; Munnik, F.; Karlik, M.; Macková, A.; Polcar, T.; Weber, W. J., 2026: . COMMUNICATIONS MATERIALS 7(1), doi: 10.1038/s43246-026-01083-3; FULL TEXT
    (HELIOS)
  • Fawaeer, S. H.; Horník, V.; Al-Qaisi, W. M.; Sedláková, V.; Mousa, M. S.; Knápek, A.; Sobola, D., 2026: . SURFACES AND INTERFACES 86, doi: 10.1016/j.surfin.2026.108769; FULL TEXT
    (KRATOS-XPS, RIGAKU3, HELIOS, VERIOS, WOOLLAM-VIS, VERSALAB, ICON-SPM, MAGNETRON)
  • Huang, Y.; Chen, Z.; Meindlhumer, M.; Hahn, R.; Holec, D.; Leiner, T.; Maier-Kiener, V.; Zheng, Y.; Zhang, Z.; Hatzenbichler, L.; Riedl, H.; Mitterer, C.; Zhang, Z., 2025: Harvesting superior intrinsic plasticity in nitride ceramics with negative stacking fault energy. ACTA MATERIALIA 286(286), p. 1 - 15, doi: 10.1016/j.actamat.2025.120774; FULL TEXT
    (TITAN, HELIOS)

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