Focused Ion Beam/Scanning Electron Microscope FEI Helios NanoLab 660 (HELIOS)


Guarantor: Ondřej Man, Ph.D.
Instrument status: Operational Operational, 25.2.2019 12:11, Worn aperture strip still in place!
Equipment placement: CEITEC Nano - A1.10
Research group: CF: CEITEC Nano

Detailed description:

FIB/SEM with sub-nm resolution, capable of imaging at very low landing energies of primary electrons (of the order of tens of volts), in-lens detection of SE and BSE, local chemical analysis. Equipped with STEM detector and EDS + EBSD analysers. Ideally suited for TEM lamella preparation and observation. Capable of 3D chemical and crystallographic analysis as well as structure reconstruction.


  • Jiao, Z.; Michalicka, J.; Was, G.S., 2018: Self-ion emulation of high dose neutron irradiated microstructure in stainless steels. JOURNAL OF NUCLEAR MATERIALS 501, p. 312 - 318, doi: 10.1016/j.jnucmat.2018.01.054
  • Michalička, J.; Jiao, Z.; Was, G., 2017: Radiation-Induced Precipitates in a Self-ion Irradiated Cold-Worked 316 Austenitic Stainless Steel Used for PWR Baffle-Bolt. PROCEEDING OF TMS 18TH ENVIRONMENTAL DEGRADATION CONFERENCE OF MATERIALS IN NUCLEAR POWER SYSTEMS – WATER REACTORS 1, p. 565 - 580, doi:
  • Knapek, A.; Horacek, M.; Hruby, F.; Sikula, J.; Kuparowitz, T.; Sobola, D., 2017: Noise behaviour of field emission cathode based on lead pencil graphite. TECHNICAL DIGEST, 2017 30TH INTERNATIONAL VACUUM NANOELECTRONICS CONFERENCE (IVNC) , p. 274 - 275
  • Horák, M., 2017: Fabrication and Characterization of Nanostructures with Functional Properties in the Field of Plasmonics. TREATISE TO STATE DOCTORAL EXAM , p. 1 - 41
  • Šik, O.; Škvarenina, L.; Caha, O.; Moravec, P.; Škarvada, P.; Belas, E.; Grmela, L., 2018: Determining the sub-surface damage of CdTe single crystals after lapping. JOURNAL OF MATERIALS SCIENCE: MATERIALS IN ELECTRONICS 29(11), p. 9652 - 9662, doi: 10.1007/s10854-018-9002-7

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