Focused Ion Beam/Scanning Electron Microscope FEI Helios NanoLab 660 (HELIOS)

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Guarantor: Ondřej Man, Ph.D.
Instrument status: Operational Operational, 20.5.2025 12:39
Equipment placement: CEITEC Nano - A1.10
Research group: CF: CEITEC Nano


Description:

FEG-type scanning electron microscope with High/Low vacuum regime with resolution at least 1,5 nm @ 15 kV (in high vacuum mode) and with chamber allowing XY stage travel at least 100x100 mm. Equipped with analytical attachments EDS + WDS + EBSD.


Publications:

  • Huang, Y.; Chen, Z.; Meindlhumer, M.; Hahn, R.; Holec, D.; Leiner, T.; Maier-Kiener, V.; Zheng, Y.; Zhang, Z.; Hatzenbichler, L.; Riedl, H.; Mitterer, C.; Zhang, Z., 2025: Harvesting superior intrinsic plasticity in nitride ceramics with negative stacking fault energy. ACTA MATERIALIA 286(286), doi: 10.1016/j.actamat.2025.120774; FULL TEXT
    (TITAN, HELIOS)
  • TRUNEC, M.; ŠŤASTNÝ, P.; ŠIŠKA VIRÁGOVÁ, E.; SOBOLA, D., 2025: Pore coalescence as an inherent problem in the sintering of zirconia nanoparticles. JOURNAL OF THE EUROPEAN CERAMIC SOCIETY 45(8), doi: 10.1016/j.jeurceramsoc.2025.117272; FULL TEXT
    (VERIOS, HELIOS, TITAN, KRATOS-XPS, RIGAKU3)
  • Tichý, M., 2024: In-situ analysis of magnetic phase transition in FeRh using transmission electron microscopy. BACHELOR´S THESIS , p. 1 - 48; FULL TEXT
    (VERSALAB, HELIOS, TITAN)
  • Štindl, J., 2024: Correlative imaging of magnetic order in antiferromagnets. BACHELOR´S THESIS , p. 1 - 44; FULL TEXT
    (VERSALAB, KERR-MICROSCOPE, HELIOS, SAW-ACCUTOM, US-CUTTER, TITAN)
  • Gazdík, R., 2024: Defect localization and analysis in GaN. MASTER´S THESIS , p. 1 - 66; FULL TEXT
    (MIRA-STAN, HELIOS, TITAN)

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Management

Vojtěch Uhlíř, Ph.D.
Vojtěch Uhlíř, Ph.D.
Research Group Leader
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