High resolution Scanning Electron Microscope FEI Verios 460L (VERIOS)

CONTACT US

Guarantor: Dina Kičmerová, Ph.D.
Instrument status: Operational Operational, 12.1.2026 13:42
Equipment placement: CEITEC Nano - A1.11
Research group: CF: CEITEC Nano
Upcoming trainings: 24.3. 09:00 - 13:00: Verios_basic (1/2) - Verios_basic (1/2): training for new users, demonstration part. Meeting point: entrance to StAn CLR labs (bldg. A, 1st floor). Bring your cleanroom stationery set if you have one. Register one slot for the Verios_basic (2/2) hands-on session to complete the training curriculum.
25.3. 09:00 - 10:30: Verios_basic (2/2) - Verios_basic (2/2): hands-on session. Bring your real sample(s) with you.
25.3. 10:30 - 12:00: Verios_basic (2/2) - Verios_basic (2/2): hands-on session. Bring your real sample(s) with you.
25.3. 12:30 - 14:00: Verios_basic (2/2) - Verios_basic (2/2): hands-on session. Bring your real sample(s) with you.


Description:

High resolution (1,0 nm @ 15 kV) scanning electron microscope with analytical attachments EDS + WDS + EBSD.


Publications:

  • Fawaeer, S. H.; Al-Qaisi, W. M.; Sedláková, V.; Mousa, M. S.; Knápek, A.; Sobola, D., 2026: Non-epitaxial integration of strain-tuned polycrystalline BiFeO3 thin films for silicon-based optoelectronics. OPTICAL MATERIALS 169, doi: 10.1016/j.optmat.2025.117577; FULL TEXT
    (RIGAKU3, KRATOS-XPS, VERIOS, ICON-SPM, WOOLLAM-VIS, MAGNETRON)
  • TVRDOŇOVÁ, A.; JAKEŠOVÁ, M.; EHLICH, J.; GLOWACKI, E., 2026: Organic photovoltaic microburritos for photo(electro)catalytic peroxide generation. CHEMICAL COMMUNICATIONS 62(4), p. 1293 - 1297, doi: 10.1039/d5cc06012e; FULL TEXT
    (EVAPORATOR, VERIOS)
  • THEKKEDATH MADHU, N.; NATARAJAN, S.; PUMERA, M., 2026: Molecularly Engineered Fluorescent Magnetic Microrobots for Sensing High-Energy Nitroaromatic Explosives in Highly Acidic Aqueous Environments. SMALL 22(5), doi: 10.1002/smll.202512670; FULL TEXT
    (JASCO, FTIR-CHEMLAB, LEICACOAT-STAN, VERIOS, MIRA-STAN)
  • CHENNAM, P.; ŘÍHOVÁ, M.; AZPEITIA, S.; SEPÚLVEDA SEPÚLVEDA, L.; KACHLÍK, M.; POUZAR, M.; CICMANCOVA, V.; MACA, K.; KNEZ, M.; MACÁK, J., 2026: Carbon fibers with infiltrated TiO2 nanocrystalline layers: photocatalytic performance. NANOSCALE 18(1), p. 413 - 424, doi: 10.1039/d5nr04109k; FULL TEXT
    (VERIOS, RIGAKU3, MIRA-STAN, KRATOS-XPS, JASCO, WITEC-RAMAN)
  • Fawaeer, S. H.; Al-Qaisi, W. M.; Sedláková, V.; Mousa, M. S.; Knápek, A.; Sobola, D., 2026: Role of Buffer Layers in Defect Chemistry and Parasitic Phase Formation of BiFeO 3 Films on Silicon. ACS OMEGA 11(5), p. 7782 - 7795, doi: 10.1021/acsomega.5c08852; FULL TEXT
    (RIGAKU3, VERIOS, KRATOS-XPS, UHV-PLD, MAGNETRON)

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