Highly Sensitive Detection of Surface and Intercalated Impurities in Graphene by LEIS

LANGMUIR

Prusa, S; Prochazka, P; Babor, P; Sikola, T; ter Veen, R; Fartmann, M; Grehl, T; Bruner, P; Roth, D; Bauer, P; Brongersma, HH, 2015: Highly Sensitive Detection of Surface and Intercalated Impurities in Graphene by LEIS. LANGMUIR 31(35), p. 9628 - 9635, doi: 10.1021/acs.langmuir.5b01935

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