Ion polisher Fischione TEM Mill 1050 (FISCHIONE-TEM MILL)

Ion polisher Fischione TEM Mill 1050
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Guarantor: Jiří Holas
Instrument status: Operational Operational, 16.5.2018 16:06
Equipment placement: CEITEC Nano - A1.08
Research group: CF: CEITEC Nano


Detailed description:

Machine for creating thin electron transparent specimens for TEM. TEM Mill incorporates two independently adjustable ion sources, liquid nitrogen specimen cooling, automatic gas control, and a vacuum system for ultra-clean specimen processing. The specimen holder accommodates double-sided milling to 0° without specimen shadowing. Tilt angles are adjustable in the range from –10° to +10°. In addition to full specimen rotation with ion beam sequencing, the programmable rocking angle control is available. The TEM Mill includes a microscope with CCD camera for better specimen viewing and polishing process control.


Publications:

  • Zboncak, M.; Ondreas, F.; Uhlir, V.; Lepcio, P.; Michalicka, J.; Jancar, J., 2020: Translation of segment scale stiffening into macroscale reinforcement in polymer nanocomposites. POLYMER ENGINEERING & SCIENCE 60(3), p. 587 - 596, doi: 10.1002/pen.25317
    (MIRA3-XMU, FISCHIONE-TEM MILL)