Relevant expertise we can offer:

  • Surface chemical analysis by X-ray Photoelectron Spectroscopy (XPS): bond specific analysis of chemical composition of solid materials; Auger Electron Spectroscopy (AES): chemical composition with <10 nm spatial resolution; Secondary Ion Mass Spectroscopy (SIMS): high sensitivity up to ppb level and 3D compositional analysis; and Low Energy Ion Scattering (LEIS): chemical analysis of top-most sample layer only.
  • In-situ monitoring of surfaces: Low Energy Electron Microscopy (LEEM): imaging and diffraction studies of in vacuum prepared samples with possibility to monitor changes during deposition, annealing and gas dosing.
  • Vacuum deposition of both inorganic and organic materials (small sample scale).
  • CVD deposition of graphene and its integration in field effect transistor (FET) devices (lithography, contacting, measurement of transport properties).


Jan Čechal, Ph.D.
Jan Čechal, Ph.D.
Research Group Leader
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