Scanning electron microscope (SEM) MIRA3 XMU (MIRA-STAN)

Scanning electron microscope (SEM) MIRA3 XMU
CONTACT US

Guarantor: Petr Lepcio, Ph.D.
Instrument status: Operational Operational, 29.8.2025 15:15
Equipment placement: CEITEC Nano - A1.11
Research group: CF: CEITEC Nano


Description:

Scanning electron microscope (SEM) MIRA3 XMU

Description

• Scanning electron microscope (SEM) is used to study the morphology and topography of conductive and non-conductive materials in high resolution (micro to nano-scale).
• Observation of surface samples with high depth of focus using multiple detection system (SE, BSE, STEM) including elemental analysis using energy dispersive spectrometer (EDS).

Applications

• Observation of both the surface and internal structure of micro and nano-objects (phase interface such as matrix-filler/reinforcement, particle distribution, aggregates and defects, fracture surfaces, porous 3D materials, units of supramolecular structure, etc.)
• evaluation of the shape and dimensions (length, diameter, volume, roughness) of powders, tubes, short fibers
• fast and highly accurate chemical microanalysis and elemental mapping of a sample surface
• qualitative elemental analysis including determination of the distribution of each element
• quantitative analysis of the individual elements in a sample
• The structural analysis of polymeric materials, biopolymers and composites, biomaterials, ceramics, bones, teeth, substrates for tissue engineering, etc.

Specification

• High Brightness Schottky Emitter
• Detectors:
SE, BSE, In-beam SE, In-Beam BSE
LVSTD
STEM detector
EDX analysis
• High-vacuum (≤9x10-3Pa) or low-vacuum mode (7-500 Pa)
• Magnification 25 to 1 000 000x
• Acceleration voltage 200 V to 30 kV
• X-Y-Z 130×130×100mm
• Maximum specimen height: 106 mm


Publications:

  • Alsoud, A.; Shaheen, AA.; Knápek, A.; Al-Bashaish, SR.; Ahmad, MDJ.; Mousa, MS.; Sobola, D., 2025: Fabrication and Electrical Characterization of Dot Capacitors for Cold Field Emission Applications. ACS OMEGA , p. 11108 - 11, doi: 10.1021/acsomega.4c10081; FULL TEXT
    (MIRA-STAN)
  • Deshmukh, S.; Vaghasiya, JV.; Michalicka, J.; Langer, R.; Otyepka, M.; Pumera, M., 2025: Phase Transition Driven Zn-Ion Battery With Laser-Processed V2C/V2O5 Electrodes for Wearable Temperature Monitoring. SMALL 21(7), doi: 10.1002/smll.202409987; FULL TEXT
    (TITAN, VERIOS, MIRA-STAN, KRATOS-XPS, WITEC-RAMAN)
  • Nittoor-Veedu, R.; Ju, XH.; Langer, M.; Gao, WL.; Otyepka, M.; Pumera, M., 2025: Periodic Table Exploration of MXenes for Efficient Electrochemical Nitrate Reduction to Ammonia. SMALL 21(10), doi: 10.1002/smll.202410105; FULL TEXT
    (KRATOS-XPS, MIRA-STAN, RIGAKU3, FTIR-CHEMLAB)
  • KOMÁRKOVÁ, M.; BENEŠÍK, M.; ČERNÁ, E.; SEDLÁČKOVÁ, L.; MOŠA, M.; VOJTOVÁ, L.; FRANC, A.; PANTŮČEK, R., 2025: The pharmaceutical quality of freeze-dried tablets containing therapeutic bacteriophages against Pseudomonas aeruginosa and Staphylococcus aureus. INTERNATIONAL JOURNAL OF PHARMACEUTICS 671, p. 1 - 9, doi: 10.1016/j.ijpharm.2025.125199; FULL TEXT
    (MIRA-STAN, LEICACOAT-STAN)
  • Joda, NN.; Edelmannova, MF.; Pavlinák, D.; Santana, VT.; Chennam, PK.; Rihova, M.; Kocí, K.; Macak, JM., 2025: Centrifugally spun hematite Fe2O3 hollow fibers: Efficient photocatalyst for H2 generation and CO2 reduction. APPLIED SURFACE SCIENCE 686, p. 1 - 12, doi: 10.1016/j.apsusc.2024.162132; FULL TEXT
    (MIRA-STAN, LEICACOAT-STAN, RIGAKU3, KRATOS-XPS, WITEC-RAMAN, BET-DEGASSER, BET-ANAMET, JASCO)

Show more publications...