Scanning Probe Microscope + microRaman + PhotoLuminiscence system NT-MDT Ntegra Spectra + Solar II (TERS)

Scanning Probe Microscope + microRaman + PhotoLuminiscence system NT-MDT Ntegra Spectra + Solar II
CONTACT US

Guarantor: Filip Münz, Ph.D.
Technology / Methodology: Optical measurements
Instrument status: Operational Operational, 9.2.2018 16:48
Research group: CF: CEITEC Nano


Detailed description:

NTEGRA Spectra is a UV-VIS-NIR combined AFM + Raman spectrometer by NT-MDT equipped also with standard optical microscope with mapping feature for conventional micro Raman spectroscopy. The equipment is capable of full polarisation measurements (for e.g. for luminescence measurement). The equipment is placed on an air floating bedboard in the clean rooms service area.


Publications:

  • Rozbořil, J., 2019: Growth and characterization of thin films of functional molecules. PH.D. THESIS , p. 1 - 115
    (RIGAKU9, ICON-SPM, TERS, NIRQUEST512)
  • Sobola, D.; Kaspar, P-; Nebojsa, A.; Hemzal, D.; Grmela, L.; Smith, S., 2019: Characterization of the native oxide on CdTe surfaces. MATERIALS SCIENCE- POLAND 37(2), p. 206 - 211, doi: 10.2478/msp-2019-0030
    (WOOLLAM-VIS, VERIOS, TERS)
  • Redondo, J.; Telychko, M.; Procházka, P.; Konečný, M.; Berger, J.; Vondráček, M.; Čechal, J.; Jelínek, P.; Švec, M., 2018: Simple device for the growth of micrometer-sized monocrystalline single-layer graphene on SiC(0001). JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A: VACUUM, SURFACES, AND FILMS 36(3), p. 031401-1 - 031401-6, doi: 10.1116/1.5008977
    (ICON-SPM, UHV-LEEM, TERS)
  • Zdrazil, L; Zahradnicek, R; Mohan, R; Sedlacek, P; Nejdl, L; Schmiedova, V; Pospisil, J; Horak, M; Weiter, M; Zmeskal, O; Hubalek, J, 2018: Preparation of graphene quantum dots through liquid phase exfoliation method. JOURNAL OF LUMINESCENCE 204, p. 203 - 208, doi: 10.1016/j.jlumin.2018.08.017
    (TITAN, VERIOS, ICON-SPM, KRATOS-XPS, TERS)
  • Konečný, M.; Bartošík, M.; Mach, J.; Švarc, V.; Nezval, D.; Piastek, J.; Procházka, P.; Cahlík, A.; Šikola, T., 2018: Kelvin Probe Force Microscopy and Calculation of Charge Transport in a Graphene/Silicon Dioxide System at Different Relative Humidity. ACS APPLIED MATERIALS AND INTERFACES 10(14), p. 11987 - 11994, doi: 10.1021/acsami.7b18041
    (TERS)

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