Scanning Probe Microscope + microRaman + PhotoLuminiscence system NT-MDT Ntegra Spectra + Solar II (TERS)

Scanning Probe Microscope + microRaman + PhotoLuminiscence system NT-MDT Ntegra Spectra + Solar II

Guarantor: Filip Münz, Ph.D.
Technology / Methodology: Optical measurements
Instrument status: Operational Operational, 9.2.2018 16:48
Research group: CF: CEITEC Nano

Detailed description:

NTEGRA Spectra is a UV-VIS-NIR combined AFM + Raman spectrometer by NT-MDT equipped also with standard optical microscope with mapping feature for conventional micro Raman spectroscopy. The equipment is capable of full polarisation measurements (for e.g. for luminescence measurement). The equipment is placed on an air floating bedboard in the clean rooms service area.


  • Klenovsky, P; Steindl, P; Geffroy, D, 2017: Excitonic structure and pumping power dependent emission blue-shift of type-II quantum dots. SCIENTIFIC REPORTS 7, doi: 10.1038/srep45568
  • Ţălu, Ş.; Papež, N.; Sobola, D.; Achour, A.; Solaymani, S., 2017: Micromorphology investigation of GaAs solar cells: case study on statistical surface roughness parameters. JOURNAL OF MATERIALS SCIENCE - MATERIALS IN ELECTRONICS 28(20), p. 15370 - 15379, doi:
  • Talu, S.; Stach, S.; Ramazanov, S.; Sobola, D.; Ramanazov, G., 2017: Multifractal characterization of epitaxial silicon carbide on silicon. MATERIALS SCIENCE-POLAND 35(3), p. 539 - 547, doi: 10.1515/msp-2017-0049
  • Hrubý, J., 2017: Preparation and Characterization of Graphene Based Hybrid Materials. MASTER´S THESIS , p. 1 - 91
    (TERS, LYRA)
  • Redondo, J.; Telychko, M.; Procházka, P.; Konečný, M.; Berger, J.; Vondráček, M.; Čechal, J.; Jelínek, P.; Švec, M., 2018: Simple device for the growth of micrometer-sized monocrystalline single-layer graphene on SiC(0001). JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A: VACUUM, SURFACES, AND FILMS 36(3), p. 031401-1 - 031401-6, doi: 10.1116/1.5008977

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