Scanning Probe Microscope + microRaman + PhotoLuminiscence system NT-MDT Ntegra Spectra + Solar II (TERS)

Scanning Probe Microscope + microRaman + PhotoLuminiscence system NT-MDT Ntegra Spectra + Solar II
CONTACT US

Guarantor: Filip Münz, Ph.D.
Technology / Methodology: Optical measurements
Instrument status: Operational Operational, 9.2.2018 16:48
Research group: CF: CEITEC Nano


Detailed description:

NTEGRA Spectra is a UV-VIS-NIR combined AFM + Raman spectrometer by NT-MDT equipped also with standard optical microscope with mapping feature for conventional micro Raman spectroscopy. The equipment is capable of full polarisation measurements (for e.g. for luminescence measurement). The equipment is placed on an air floating bedboard in the clean rooms service area.


Publications:

  • Rozbořil, J., 2019: Growth and characterization of thin films of functional molecules. PH.D. THESIS , p. 1 - 115
    (RIGAKU9, ICON-SPM, TERS)
  • Dvořák, P., 2018: Nanophotonics. PH.D. THESIS , p. 1 - 134
    (SNOM-NANONICS, LYRA, TERS, EVAPORATOR, FTIR, WOOLLAM-VIS)
  • Procházka, P., 2018: Fabrication of graphene and study of its physical properties. PH.D. THESIS , p. 1 - 139
    (ALD, DIENER, EVAPORATOR, MIRA, PECVD, TERS, WIRE-BONDER)
  • Čalkovský, V., 2018: Deposition and characterization of GaN nanocrystals with a metal core. MASTER´S THESIS , p. 1 - 67
    (VERIOS, TERS, KRATOS-XPS)
  • Ţălu, Ş.; Yadav, R. P.; Šik, O.; Sobola, D.; Dallaev, R.; Solaymani, S.; Man, O., 2018: How topographical surface parameters are correlated with CdTe monocrystal surface oxidation. MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING 85, p. 15 - 23, doi: 10.1016/j.mssp.2018.05.030
    (VERIOS, TERS, WOOLLAM-VIS)

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