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Home Research Selected Publications Testing the performance of Murphy-Good plots when applied to current-voltage characteristics of Si field electron emission tips
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Testing the performance of Murphy-Good plots when applied to current-voltage characteristics of Si field electron emission tips

2021 34TH INTERNATIONAL VACUUM NANOELECTRONICS CONFERENCE (IVNC)

ALLAHAM, M.; BUCHNER, P.; SCHREINER, R.; KNÁPEK, A., 2021: Testing the performance of Murphy-Good plots when applied to current-voltage characteristics of Si field electron emission tips. 2021 34TH INTERNATIONAL VACUUM NANOELECTRONICS CONFERENCE (IVNC) , p. 1 - 2, doi: 10.1109/IVNC52431.2021.9600690; FULL TEXT

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