X-ray diffractometer with high brightness source Rigaku SmartLab 9kW (RIGAKU9)


Guarantor: Ondřej Man, Ph.D.
Instrument status: Operational Operational, 13.9.2018 08:13
Equipment placement: CEITEC Nano - A1.16
Research group: CF: CEITEC Nano

Detailed description:

Rigaku Smartlab 9kW is a novel high-resolution X-ray diffractometer dedicated to characterization of thin films and nano-structures. Due to its modularity, the instrument allows for large variety of X-ray diffraction and scattering techniques. The non-destructive analytical techniques reveal information about crystal structure, chemical composition, and physical properties of materials, thin films, and nano-structures.


  • Suchánková, K., 2019: Molecular beam deposition of thin films of organic semiconductors and the structure of the film. MASTER´S THESIS , p. 1 - 64
  • Rozbořil, J., 2019: Growth and characterization of thin films of functional molecules. PH.D. THESIS , p. 1 - 115
  • Rozbořil, J.; Broch, K.; Resel, R.; Caha, O.; Münz, F.; Mikulík, P.; Anthony, J. E.; Sirringhaus, H.; Novák, J., 2019: Annealing Behavior with Thickness Hindered Nucleation in Small-Molecule Organic Semiconductor Thin Films. CRYSTAL GROWTH & DESIGN 19(7), p. 3777 - 3784, doi: 10.1021/acs.cgd.9b00213
  • Fallarino, L.; Oelschlägel, A.; Arregi, J. A.; Bashkatov, A.; Samad, F.; Böhm, B.; Chesnel, K.; Hellwig, O., 2019: Control of domain structure and magnetization reversal in thick Co/Pt multilayers. PHYSICAL REVIEW B 99(2), p. 024431-1 - 024431-16, doi: 10.1103/PhysRevB.99.024431
  • Pressacco, F.; Uhlíř, V.; Gatti, M.; Nicolaou, A.; Bendounan, A.; Arregi, J. A.; Patel, S. K. K.; Fullerton, E. E.; Krizmancic, D.; Sirotti, F., 2018: Laser induced phase transition in epitaxial FeRh layers studied by pump-probe valence band photoemission. STRUCTURAL DYNAMICS 5(3), p. 034501-1 - 034501-11, doi: 10.1063/1.5027809

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