X-ray diffractometer with high brightness source Rigaku SmartLab 9kW (RIGAKU9)

CONTACT US

Guarantor: Ondřej Man, Ph.D.
Instrument status: Operational Operational, 13.9.2018 08:13
Equipment placement: CEITEC Nano - A1.16
Research group: CF: CEITEC Nano


Detailed description:

Rigaku Smartlab 9kW is a novel high-resolution X-ray diffractometer dedicated to characterization of thin films and nano-structures. Due to its modularity, the instrument allows for large variety of X-ray diffraction and scattering techniques. The non-destructive analytical techniques reveal information about crystal structure, chemical composition, and physical properties of materials, thin films, and nano-structures.


Publications:

  • Gablech, I; Caha, O; Svatos, V; Pekarek, J; Neuzil, P; Sikola, T, 2017: Stress-free deposition of [001] preferentially oriented titanium thin film by Kaufman ion-beam source. THIN SOLID FILMS 638, p. 57 - 62, doi: 10.1016/j.tsf.2017.07.039
    (ICON-SPM, KAUFMAN, RIGAKU9)
  • Dubroka, A; Caha, O; Hroncek, M; Fris, P; Orlita, M; Holy, V; Steiner, H; Bauer, G; Springholz, G; Humlicek, J, 2017: Interband absorption edge in the topological insulators Bi-2(Te1-xSex)(3). PHYSICAL REVIEW B 96(23), doi: 10.1103/PhysRevB.96.235202
    (FTIR, RIGAKU9, WOOLLAM-MIR, WOOLLAM-VIS)
  • Friš, P.; Munzar, D.; Caha, O.; Dubroka, A., 2018: Direct observation of double exchange in ferromagnetic La0.7Sr0.3CoO3 by broadband ellipsometry. PHYSICAL REVIEW B 97(4), p. 045137-1 - 045137-5, doi: 10.1103/PhysRevB.97.045137
    (WOOLLAM-MIR, WOOLLAM-VIS, RIGAKU9, FTIR, CRYOGENIC)
  • Dieterle, J; Broch, K; Frank, H; Duva, G; Storzer, T; Hinderhofer, A; Novak, J; Gerlach, A; Schreiber, F, 2017: Delayed phase separation in growth of organic semiconductor blends with limited intermixing. PHYSICA STATUS SOLIDI-RAPID RESEARCH LETTERS 11(3), doi: 10.1002/pssr.201600428
    (RIGAKU9)
  • Wang, CN; Caha, O; Munz, F; Kostelnik, P; Novak, T; Humlicek, J, 2017: Mid-infrared ellipsometry, Raman and X-ray diffraction studies of AlxGa1-xN/AlN/Si structures. APPLIED SURFACE SCIENCE 421, p. 859 - 865, doi: 10.1016/j.apsusc.2017.02.056
    (WOOLLAM-MIR, RIGAKU9, TERS)

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