X-ray Photoelectron Spectroscopy Axis Supra (KRATOS-XPS)

CONTACT US

Guarantor: Josef Polčák, Ph.D.
Instrument status: Some Issues Some Issues, 3.3.2023 13:43, Please, do not use magazine position 3, till magazine part is changed. Only two bars available till service visit. For advanced methods, please ask quarantor.
Equipment placement: CEITEC Nano - C1.38
Research group: CF: CEITEC Nano


Description:

AXIS SupraTM is an X-ray photoelectron spectrometer (XPS) with unrivalled automation and ease of use for materials surface characterisation. The patented AXIS technology ensures high electron collection efficiency in spectroscopy mode and low aberrations at high magnifications in parallel imaging mode.


Publications:

  • Kelarová, Š.; Přibyl, R.; Homola, V.; Polčák, J.; Charvátová Campbell, A.; Havlíček, M.; Vrchovecká, K.; Václavik, R.; Zábranský, L.; Buršíková, V., 2023: Influence of the argon ratio on the structure and properties of thin films prepared using PECVD in TMSAc/Ar mixtures. VACUUM 207, doi: 10.1016/j.vacuum.2022.111634; FULL TEXT
    (KRATOS-XPS, ICON-SPM)
  • Vida, J.; Gemeiner, P.; Pavličková, M.; Mazalová, M.; Souček, P.; Plašienka, D.; Homola, T., 2023: Nanocrystalline TiO2/Ti3C2Tx MXene composites with a tunable work function prepared using atmospheric pressure oxygen plasma. NANOSCALE 15(3), p. 1289 - 1298, doi: 10.1039/d2nr04465j; FULL TEXT
    (TITAN, KRATOS-XPS)
  • KONOPATSKY, A.; POPOV, Z.; BONDAREV, A.; POLČÁK, J.; SHTANSKY, D., 2023: Structure, magnetic and adsorption properties of novel FePt/h-BN heteromaterials. NANO RESEARCH , p. 1473 - 9, doi: 10.1007/s12274-022-4672-0; FULL TEXT
    (KRATOS-XPS)
  • BYTEŠNÍKOVÁ, Z.; PEČENKA, J.; TEKIELSKA, D.; KISS, T.; ŠVEC, P.; RIDOŠKOVÁ, A.; BEZDIČKA, P.; PEKÁRKOVÁ, J.; EICHMEIER, A.; POKLUDA, R.; ADAM, V.; RICHTERA, L., 2022: Reduced graphene oxide-based nanometal-composite containing copper and silver nanoparticles protect tomato and pepper against Xanthomonas euvesicatoria infection. CHEMICAL AND BIOLOGICAL TECHNOLOGIES IN AGRICULTURE 9(1), doi: 10.1186/s40538-022-00347-7; FULL TEXT
    (KRATOS-XPS)
  • PEJCHAL, T.; BUKVIŠOVÁ, K.; VALLEJOS VARGAS, S.; CITTERBERG, D.; ŠIKOLA, T.; KOLÍBAL, M., 2022: Ga interaction with ZnO surfaces: Diffusion and melt-back etching. APPLIED SURFACE SCIENCE 583, p. 152475 - 6, doi: 10.1016/j.apsusc.2022.152475; FULL TEXT
    (WITEC-RAMAN, UHV-DEPOSITION, UHV-PREPARATION, NANOSAM, VERIOS, KRATOS-XPS, HELIOS)

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