Bringing real-time traceability to high-speed atomic force microscopy

MEASUREMENT SCIENCE AND TECHNOLOGY

HEAPS, E; YACOOT, A.; DONGMO, H.; PICCO, l.; PAYTON, O.D.; RUSSEL-PAVIER, F.; KLAPETEK, P, 2020: Bringing real-time traceability to high-speed atomic force microscopy. MEASUREMENT SCIENCE AND TECHNOLOGY 31(7), p. 1 - 11, doi: 10.1088/1361-6501/ab7ca9; FULL TEXT

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