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CCD and scientific-CMOS detectors for submicron laboratory based X-ray Computed Tomography

THE E-JOURNAL OF NONDESTRUCTIVE TESTING

ŠALPLACHTA, J.; ZIKMUND, T.; HORVÁTH, M., TAKEDA, Y., OMOTE, K., PÍNA, L., KAISER, J., 2019: CCD and scientific-CMOS detectors for submicron laboratory based X-ray Computed Tomography. THE E-JOURNAL OF NONDESTRUCTIVE TESTING , p. 1 - 8; FULL TEXT

Research Groups:

• Advanced Instrumentation and Methods for Materials Characterization

CEITEC authors:

• Tomáš Zikmund, Ph.D.
• Prof. Jozef Kaiser, Ph.D.
• Jakub Šalplachta