Electron hopping rate measurements in ITO junctions: Charge diffusion in a layer-by-layer deposited ruthenium(II)-bis(benzimidazolyl)pyridine-phosphonate-TiO2 film

JOURNAL OF ELECTROANALYTICAL CHEMISTRY

Cummings, CY; Wadhawan, JD; Nakabayashi, T; Haga, M; Rassaei, L; Dale, SEC; Bending, S; Pumera, M; Parker, SC; Marken, F, 2011: Electron hopping rate measurements in ITO junctions: Charge diffusion in a layer-by-layer deposited ruthenium(II)-bis(benzimidazolyl)pyridine-phosphonate-TiO2 film. JOURNAL OF ELECTROANALYTICAL CHEMISTRY 657(2019-02-01T00:00:00.000), p. 196 - 201, doi: 10.1016/j.jelechem.2011.04.010

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