Kelvin Probe Force Microscopy and Calculation of Charge Transport in a Graphene/Silicon Dioxide System at Different Relative Humidity

ACS Applied Materials and Interfaces

Konečný, M.; Bartošík, M.; Mach, J.; Švarc, V.; Nezval, D.; Piastek, J.; Procházka, P.; Cahlík, A.; Šikola, T., 2018: Kelvin Probe Force Microscopy and Calculation of Charge Transport in a Graphene/Silicon Dioxide System at Different Relative Humidity. ACS APPLIED MATERIALS AND INTERFACES 10(14), p. 11987 - 11994, doi: 10.1021/acsami.7b18041

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