Mapping of properties of thin plasma jet films using imaging spectroscopic reflectometry

MEASUREMENT SCIENCE & TECHNOLOGY

Necas, D; Cudek, V; Vodak, J; Ohlidal, M; Klapetek, P; Benedikt, J; Rugner, K; Zajickova, L, 2014: Mapping of properties of thin plasma jet films using imaging spectroscopic reflectometry. MEASUREMENT SCIENCE & TECHNOLOGY 25(11), doi: 10.1088/0957-0233/25/11/115201

Research Groups:

• Plasma Technologies - Lenka Zajíčková
• Development of Methods for Analysis and Measuring - Petr Klapetek

CEITEC authors:

• David Nečas, Ph.D.
• Lenka Zajíčková, Ph.D.
• Petr Klapetek, Ph.D.