Mapping of properties of thin plasma jet films using imaging spectroscopic reflectometry

MEASUREMENT SCIENCE & TECHNOLOGY

Necas, D; Cudek, V; Vodak, J; Ohlidal, M; Klapetek, P; Benedikt, J; Rugner, K; Zajickova, L, 2014: Mapping of properties of thin plasma jet films using imaging spectroscopic reflectometry. MEASUREMENT SCIENCE & TECHNOLOGY 25(11), doi: 10.1088/0957-0233/25/11/115201

CEITEC authors:

David Nečas, Ph.D.
Petr Klapetek, Ph.D.
Lenka Zajíčková, Ph.D.