NIR-UV spectroscopic ellipsometer J. A. Woollam V-VASE (WOOLLAM-VIS)

NIR-UV spectroscopic ellipsometer J. A. Woollam V-VASE
CONTACT US

Guarantor: Alois Nebojsa
Technology / Methodology: Optical measurements
Instrument status: Operational Operational, 9.2.2018 16:48
Equipment placement: CEITEC Nano - C1.21
Research group: CF: CEITEC Nano


Detailed description:

The VASE is most accurate and versatile ellipsometer for research on all types of materials: semiconductors, dielectrics, polymers, metals, multi-layers, and more. It combines high accuracy and precision with a wide spectral range from 193 to 2000nm. Variable wavelength and angle of incidence allow flexible measurement capabilities.


Publications:

  • Papež, N.; Gajdoš, A.; Sobola, D.; Dallaev, R.; Macků, R.; Škarvada, P.; Grmela, L., 2020: Effect of gamma radiation on properties and performance of GaAs based solar cells. APPLIED SURFACE SCIENCE 527, p. 146766-1 - 146766-11, doi: 10.1016/j.apsusc.2020.146766
    (WITEC-RAMAN, LYRA, SIMS, WOOLLAM-VIS, FTIR)
  • Kaushik, P.; Eliáš, M.; Michalička, J.; Hegemann, D.; Pytlíček, Z.; Nečas, D.; Zajíčková, L., 2019: Atomic layer deposition of titanium dioxide on multi-walled carbon nanotubes for ammonia gas sensing. SURFACE AND COATINGS TECHNOLOGY 370, p. 235 - 243, doi: 10.1016/j.surfcoat.2019.04.031
    (ALD, EVAPORATOR, PECVD-NANOFAB, WOOLLAM-VIS, RIGAKU3, VERIOS, TITAN, KRATOS-XPS)
  • Kaspar, P.; Sobola, D.; Dallaev, R.; Ramazanov, S.; Nebojsa, A.; Rezaee, S.; Grmela, L., 2019: Characterization of Fe2O3 thin film on highly oriented pyrolytic graphite by AFM, Ellipsometry and XPS. APPLIED SURFACE SCIENCE 493, p. 673 - 678, doi: 10.1016/j.apsusc.2019.07.058
    (EVAPORATOR, WOOLLAM-VIS, ICON-SPM, KRATOS-XPS)
  • Sobola, D.; Kaspar, P-; Nebojsa, A.; Hemzal, D.; Grmela, L.; Smith, S., 2019: Characterization of the native oxide on CdTe surfaces. MATERIALS SCIENCE- POLAND 37(2), p. 206 - 211, doi: 10.2478/msp-2019-0030
    (WOOLLAM-VIS, VERIOS, TERS)
  • Gablech, I; Svatos, V; Caha, O; Dubroka, A; Pekarek, J; Klempa, J; Neuzil, P; Schneider, M; Sikola, T, 2019: Preparation of high-quality stress-free (001) aluminum nitride thin film using a dual Kaufman ion-beam source setup. THIN SOLID FILMS 670, p. 105 - 112, doi: 10.1016/j.tsf.2018.12.035
    (KAUFMAN, ICON-SPM, RIGAKU9, WOOLLAM-VIS)

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