NIR-UV spectroscopic ellipsometer J. A. Woollam V-VASE (WOOLLAM-VIS)

Detailed description:

The VASE is most accurate and versatile ellipsometer for research on all types of materials: semiconductors, dielectrics, polymers, metals, multi-layers, and more. It combines high accuracy and precision with a wide spectral range from 193 to 2000nm. Variable wavelength and angle of incidence allow flexible measurement capabilities.

Publications:

• Kaspar, P.; Sobola, D.; Dallaev, R.; Ramazanov, S.; Nebojsa, A.; Rezaee, S.; Grmela, L., 2019: Characterization of Fe2O3 thin film on highly oriented pyrolytic graphite by AFM, Ellipsometry and XPS. APPLIED SURFACE SCIENCE 493, p. 673 - 678, doi: 10.1016/j.apsusc.2019.07.058
  (EVAPORATOR, KRATOS-XPS, WOOLLAM-VIS, ICON-SPM)
• Sobola, D.; Kaspar, P-; Nebojsa, A.; Hemzal, D.; Grmela, L.; Smith, S., 2019: Characterization of the native oxide on CdTe surfaces. MATERIALS SCIENCE- POLAND 37(2), p. 206 - 211, doi: 10.2478/msp-2019-0030
  (WOOLLAM-VIS, VERIOS, TERS)
• Gablech, I; Svatos, V; Caha, O; Dubroka, A; Pekarek, J; Klempa, J; Neuzil, P; Schneider, M; Sikola, T, 2019: Preparation of high-quality stress-free (001) aluminum nitride thin film using a dual Kaufman ion-beam source setup. THIN SOLID FILMS 670, p. 105 - 112, doi: 10.1016/j.tsf.2018.12.035
  (KAUFMAN, ICON-SPM, RIGAKU9, WOOLLAM-VIS)
• Pokorný, D., 2019: Morphology study of ultra thin layers by XPS analysis of multiple peaks of a single element. MASTER´S THESIS , p. 1 - 71
  (KRATOS-XPS, WOOLLAM-VIS, ALD)
• Kaushik, P.; Eliáš, M.; Michalička, J.; Hegemann, D.; Pytlíček, Z.; Nečas, D.; Zajíčková, L., 2019: Atomic layer deposition of titanium dioxide on multi-walled carbon nanotubes for ammonia gas sensing. SURFACE AND COATINGS TECHNOLOGY 370, p. 235 - 243, doi: 10.1016/j.surfcoat.2019.04.031
  (ALD, EVAPORATOR, PECVD-NANOFAB, WOOLLAM-VIS, RIGAKU3, KRATOS-XPS, VERIOS, TITAN)

• Friš, P.; Munzar, D.; Caha, O.; Dubroka, A., 2018: Direct observation of double exchange in ferromagnetic La0.7Sr0.3CoO3 by broadband ellipsometry. PHYSICAL REVIEW B 97(4), p. 045137-1 - 045137-5, doi: 10.1103/PhysRevB.97.045137
  (WOOLLAM-MIR, WOOLLAM-VIS, RIGAKU9, FTIR, CRYOGENIC)
• Ţălu, Ş.; Yadav, R. P.; Šik, O.; Sobola, D.; Dallaev, R.; Solaymani, S.; Man, O., 2018: How topographical surface parameters are correlated with CdTe monocrystal surface oxidation. MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING 85, p. 15 - 23, doi: 10.1016/j.mssp.2018.05.030
  (VERIOS, TERS, WOOLLAM-VIS)
• Dvořák, P., 2018: Nanophotonics. PH.D. THESIS , p. 1 - 134
  (SNOM-NANONICS, LYRA, TERS, EVAPORATOR, FTIR, WOOLLAM-VIS)
• Ligmajer, F., 2018: Advanced plasmonic materials for metasurfaces and photochemistry. PH.D. THESIS , p. 1 - 142
  (VERIOS, ICON-SPM, RIGAKU9, SNOM-NANONICS, FTIR, WOOLLAM-VIS, TITAN)
• Klenovsky, P; Zuda, J; Klapetek, P; Humlicek, J, 2017: Ellipsometry of surface layers on a 1-kg sphere from natural silicon. APPLIED SURFACE SCIENCE 421, p. 542 - 546, doi: 10.1016/j.apsusc.2016.08.135
  (WOOLLAM-VIS)
• Dubroka, A; Caha, O; Hroncek, M; Fris, P; Orlita, M; Holy, V; Steiner, H; Bauer, G; Springholz, G; Humlicek, J, 2017: Interband absorption edge in the topological insulators Bi-2(Te1-xSex)(3). PHYSICAL REVIEW B 96(23), doi: 10.1103/PhysRevB.96.235202
  (FTIR, RIGAKU9, WOOLLAM-MIR, WOOLLAM-VIS)
• Fris, P.; Dubroka, A., 2017: Vacuum variable-angle far-infrared ellipsometer. APPLIED SURFACE SCIENCE 421, p. 430 - 434, doi: 10.1016/j.apsusc.2016.10.125
  (FTIR, WOOLLAM-VIS)
• Kukolova, A., 2017: Experimental study of electronic properties of manganites and electron stimulated desorption. MASTER´S THESIS , p. 1 - 91
  (WOOLLAM-MIR, WOOLLAM-VIS, CRYOGENIC)

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