NIR-UV spectroscopic ellipsometer J. A. Woollam V-VASE (WOOLLAM-VIS)

NIR-UV spectroscopic ellipsometer J. A. Woollam V-VASE
CONTACT US

Guarantor: Alois Nebojsa
Technology / Methodology: Optical measurements
Instrument status: Operational Operational, 20.4.2026 12:14
Equipment placement: CEITEC Nano - C1.21
Research group: CF: CEITEC Nano


Description:

The VASE is most accurate and versatile ellipsometer for research on all types of materials: semiconductors, dielectrics, polymers, metals, multi-layers, and more. It combines high accuracy and precision with a wide spectral range from 193 to 2000nm. Variable wavelength and angle of incidence allow flexible measurement capabilities, absolute transmissivity and light scattering can be also measured.


Publications:

  • FAWAEER, S.; AL-QAISI, W.; SEDLÁKOVÁ, V.; MOUSA, M.; KNÁPEK, A.; SOBOLA, D., 2026: Non-epitaxial integration of strain-tuned polycrystalline BiFeO3 thin films for silicon-based optoelectronics. OPTICAL MATERIALS 169, doi: 10.1016/j.optmat.2025.117577; FULL TEXT
    (RIGAKU3, VERIOS, ICON-SPM, WOOLLAM-VIS, MAGNETRON, KRATOS-XPS)
  • Hajduček, J.; Andrieux, A.; Arregi, J. A.; Tichý, M.; Cattaneo, P.; Ferrari, B.; Carbone, F.; Uhlíř, V.; LaGrange, T., 2026: Dislocation-driven nucleation type switching across repeated ultrafast magnetostructural phase transition. PHYSICAL REVIEW B 113(1), doi: 10.1103/k8nj-p557; FULL TEXT
    (MAGNETRON, RIGAKU9, VERSALAB, WOOLLAM-VIS)
  • FAWAEER, S.; AL-QAISI, W.; SEDLÁKOVÁ, V.; MOUSA, M.; KNÁPEK, A.; SOBOLA, D., 2025: Substrate-temperature-driven phase stabilization and strain modulation in BiFeO3/Ti/Si heterostructures for scalable silicon integration. JOURNAL OF ALLOYS AND COMPOUNDS 1047, doi: 10.1016/j.jallcom.2025.184949; FULL TEXT
    (VERIOS, ICON-SPM, WOOLLAM-VIS, KRATOS-XPS)
  • KEPIČ, P.; HORÁK, M.; KABÁT, J.; HÁJEK, M.; KONEČNÁ, A.; ŠIKOLA, T.; LIGMAJER, F., 2025: Coexisting Phases of Individual VO2 Nanoparticles for Multilevel Nanoscale Memory. ACS NANO 19(1), p. 1167 - 1176, doi: 10.1021/acsnano.4c13188; FULL TEXT
    (WOOLLAM-VIS, TITAN)
  • Pham, N. S.; Huong, N. Q.; Pazourek, P.; Meduna, M.; Caha, O.; Hong, N. H., 2025: Pristine SnO2 thin films: origins of high Curie temperature. APPLIED PHYSICS A 131(11), doi: 10.1007/s00339-025-09031-7; FULL TEXT
    (LYRA, WOOLLAM-VIS, CRYOGENIC, KRATOS-XPS)

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