NIR-UV spectroscopic ellipsometer J. A. Woollam V-VASE (WOOLLAM-VIS)

NIR-UV spectroscopic ellipsometer J. A. Woollam V-VASE
CONTACT US

Guarantor: Alois Nebojsa
Technology / Methodology: Optical measurements
Instrument status: Operational Operational, 3.10.2025 14:15
Equipment placement: CEITEC Nano - C1.21
Research group: CF: CEITEC Nano


Description:

The VASE is most accurate and versatile ellipsometer for research on all types of materials: semiconductors, dielectrics, polymers, metals, multi-layers, and more. It combines high accuracy and precision with a wide spectral range from 193 to 2000nm. Variable wavelength and angle of incidence allow flexible measurement capabilities, absolute transmissivity and light scattering can be also measured.


Publications:

  • Franta, D.; Vohánka, J.; Dvořák, J.; Franta, P.; Ohlídal, I.; Klapetek, P.; Březina, J.; Škoda, D., 2025: Wide spectral range optical characterization of tantalum pentoxide (Ta 2 O 5 ) films by the universal dispersion model. OPTICAL MATERIALS EXPRESS 15(4), doi: 10.1364/OME.550708; FULL TEXT
    (WOOLLAM-MIR, WOOLLAM-VIS, VUVAS)
  • JANŮŠOVÁ, M.; NEČAS, D.; NAVASCUES, P.; HEGEMANN, D.; GAVRANOVIĆ, S.; ZAJÍČKOVÁ, L., 2025: Insight into plasma polymerization with a significant contribution of etching to the deposition process. SURFACE & COATINGS TECHNOLOGY 503, doi: 10.1016/j.surfcoat.2025.131962; FULL TEXT
    (KRATOS-XPS, DEKTAK, WOOLLAM-VIS)
  • Pham, N. S.; Hong, N. H., 2025: Modulation of room temperature ferromagnetism in WO3 thin films on low-cost Si wafers. SOLID STATE COMMUNICATIONS 397, doi: 10.1016/j.ssc.2024.115807; FULL TEXT
    (LYRA, KRATOS-XPS, VERSALAB, RIGAKU3, ICON-SPM, WOOLLAM-VIS, )
  • Slovák, R., 2024: Experimental measurement of dielectric functions using ellipsometry. BACHELOR´S THESIS , p. 1 - 45; FULL TEXT
    (EVAPORATOR, WOOLLAM-VIS, ICON-SPM)
  • KEPIČ, P.; LIŠKA, P.; IDESOVÁ, B.; CAHA, O.; LIGMAJER, F.; ŠIKOLA, T., 2024: Pulsed laser deposition of Sb2S3 films for phase-change tunable nanophotonics. NEW JOURNAL OF PHYSICS 26(1), p. 1 - 8, doi: 10.1088/1367-2630/ad1696; FULL TEXT
    (ICON-SPM, KRATOS-XPS, LYRA, ALD-FIJI, WITEC-RAMAN, RIGAKU9, WOOLLAM-VIS)

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