NIR-UV spectroscopic ellipsometer J. A. Woollam V-VASE (WOOLLAM-VIS)

NIR-UV spectroscopic ellipsometer J. A. Woollam V-VASE
CONTACT US

Guarantor: Alois Nebojsa
Technology / Methodology: Optical measurements
Instrument status: Operational Operational, 9.2.2018 16:48
Equipment placement: CEITEC Nano - C1.21
Research group: CF: CEITEC Nano


Detailed description:

The VASE is most accurate and versatile ellipsometer for research on all types of materials: semiconductors, dielectrics, polymers, metals, multi-layers, and more. It combines high accuracy and precision with a wide spectral range from 193 to 2000nm. Variable wavelength and angle of incidence allow flexible measurement capabilities.


Publications:

  • Kaushik, P.; Eliáš, M.; Michalička, J.; Hegemann, D.; Pytlíček, Z.; Nečas, D.; Zajíčková, L., 2019: Atomic layer deposition of titanium dioxide on multi-walled carbon nanotubes for ammonia gas sensing. SURFACE AND COATINGS TECHNOLOGY 370, p. 235 - 243, doi: 10.1016/j.surfcoat.2019.04.031
    (ALD, EVAPORATOR, PECVD-NANOFAB, WOOLLAM-VIS, RIGAKU3, KRATOS-XPS, VERIOS, TITAN)
  • Kaspar, P.; Sobola, D.; Dallaev, R.; Ramazanov, S.; Nebojsa, A.; Rezaee, S.; Grmela, L., 2019: Characterization of Fe2O3 thin film on highly oriented pyrolytic graphite by AFM, Ellipsometry and XPS. APPLIED SURFACE SCIENCE 493, p. 673 - 678, doi: 10.1016/j.apsusc.2019.07.058
    (EVAPORATOR, KRATOS-XPS, WOOLLAM-VIS, ICON-SPM)
  • Sobola, D.; Kaspar, P-; Nebojsa, A.; Hemzal, D.; Grmela, L.; Smith, S., 2019: Characterization of the native oxide on CdTe surfaces. MATERIALS SCIENCE- POLAND 37(2), p. 206 - 211, doi: 10.2478/msp-2019-0030
    (WOOLLAM-VIS, VERIOS, TERS)
  • Ţălu, Ş.; Yadav, R. P.; Šik, O.; Sobola, D.; Dallaev, R.; Solaymani, S.; Man, O., 2018: How topographical surface parameters are correlated with CdTe monocrystal surface oxidation. MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING 85, p. 15 - 23, doi: 10.1016/j.mssp.2018.05.030
    (VERIOS, TERS, WOOLLAM-VIS)
  • Dvořák, P., 2018: Nanophotonics. PH.D. THESIS , p. 1 - 134
    (SNOM-NANONICS, LYRA, TERS, EVAPORATOR, FTIR, WOOLLAM-VIS)

Show more publications...