Scanning Near-field Optical Microscopy Nanonics Imaging MV 4000 (SNOM-NANONICS)

Description:

Complex microscopy and analysis of surfaces, (ultra)thin films and micro/nanostructures mostly ex situ monitoring of semi-products prepared in individual steps of technologies available at CEITEC or outside. Microscopy provided by an advanced electron beam microscopy and top scanning probe techniques. Analysis based on the key surface science methods like XPS, AES and SIMS. Utilizing ion beam sputtering in surface cleaning and depth profiling of (ultra)thin films.

Publications:

• KLOK, P.; LIŠKA, P.; KŘÁPEK, V.; ČERNEK, O.; NOVÁČEK, Z.; ŠAMOŘIL, T.; BOUCHAL, P.; KRATOCHVÍL, M.; ULČ, F.; ČECHÁČEK, J.; SPOUSTA, J.; ŠIKOLA, T.; VIEWEGH, P., 2025: Applying time-resolved photoluminescence in scanning near-field optical microscopy to map charge-carrier dynamics in CsPbBr3 nanocrystals. JOURNAL OF APPLIED PHYSICS 138(22), doi: 10.1063/5.0297312; FULL TEXT
  (SNOM-NANONICS, LYRA, HELIOS, ICON-SPM, WITEC-RAMAN)
• ROVENSKÁ, K.; LIGMAJER, F.; IDESOVÁ, B.; KEPIČ, P.; LIŠKA, J.; CHOCHOL, J.; ŠIKOLA, T., 2023: . OPTICS EXPRESS 31(26), p. 43048 - 9, doi: 10.1364/OE.506069; FULL TEXT
  (EVAPORATOR, MIRA-EBL, RIE-CHLORINE, ALD-FIJI, SNOM-NANONICS, TUBE-FURNACE)
• LIŠKA, J.; HUDEC, R.; MIKULÁŠEK, Z.; ZEJDA, M.; JANÍK, J.; ŠTROBL, J., 2022: . REVISTA MEXICANA DE ASTRONOMIA Y ASTROFISICA 58(1), p. 155 - 14, doi: 10.22201/ia.01851101p.2022.58.01.12; FULL TEXT
  (SNOM-NANONICS)
• DVOŘÁK, P.; KLOK, P.; KVAPIL, M.; HRTOŇ, M.; BOUCHAL, P.; KRPENSKÝ, J.; KŘÁPEK, V.; ŠIKOLA, T., 2022: . NANOPHOTONICS 11(19), p. 1 - 12, doi: 10.1515/nanoph-2022-0215; FULL TEXT
  (SNOM-NANONICS, LYRA)
• Kepič, P., 2021: . MASTER'S THESIS , p. 1 - 76; FULL TEXT
  (MIRA-EBL, EVAPORATOR, DEKTAK, WITEC-RAMAN, SNOM-NANONICS, LYRA, ICON-SPM, KRATOS-XPS)

• Liška, P., 2021: . MASTER'S THESIS , p. 1 - 91; FULL TEXT
  (NANOSAM, SNOM-NANONICS, ICON-SPM, LYRA, TITAN, VERIOS, WITEC-RAMAN, SIMS, KRATOS-XPS)
• Babocký, J., 2020: . PH.D. THESIS , p. 1 - 104; FULL TEXT
  (MIRA-EBL, RAITH, EVAPORATOR, SNOM-NANONICS, ICON-SPM)
• HORÁK, M.; KŘÁPEK, V.; HRTOŇ, M.; KONEČNÁ, A.; LIGMAJER, F.; STÖGER-POLLACH, M.; ŠAMOŘIL, T.; PATÁK, A.; ÉDES, Z.; METELKA, O.; BABOCKÝ, J.; ŠIKOLA, T., 2019: . SCIENTIFIC REPORTS 9, p. 1 - 11, doi: 10.1038/s41598-019-40500-1; FULL TEXT
  (FTIR, HELIOS, MAGNETRON, SNOM-NANONICS, TITAN, LYRA)
• Dvořák, P., 2018: . PH.D. THESIS , p. 1 - 134
  (SNOM-NANONICS, EVAPORATOR, FTIR, WOOLLAM-VIS, LYRA)
• DVOŘÁK, P.; KVAPIL, M.; BOUCHAL, P.; ÉDES, Z.; ŠAMOŘIL, T.; HRTOŇ, M.; LIGMAJER, F.; KŘÁPEK, V.; ŠIKOLA, T., 2018: . NANOSCALE 10(45), p. 21363 - 7, doi: 10.1039/c8nr07438k; FULL TEXT
  (SNOM-NANONICS, LYRA)
• Ligmajer, F., 2018: . PH.D. THESIS , p. 1 - 142
  (VERIOS, RIGAKU9, SNOM-NANONICS, FTIR, WOOLLAM-VIS, TITAN, ICON-SPM)
• DVOŘÁK, P.; ÉDES, Z.; KVAPIL, M.; ŠAMOŘIL, T.; LIGMAJER, F.; HRTOŇ, M.; KALOUSEK, R.; KŘÁPEK, V.; DUB, P.; SPOUSTA, J.; VARGA, P.; ŠIKOLA, T., 2017: . OPTICS EXPRESS 25(14), p. 16560 - 13, doi: 10.1364/OE.25.016560; FULL TEXT
  (EVAPORATOR, SNOM-NANONICS, LYRA)

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