Surface analysis of epitaxially grown GeSn alloys with Sn contents between 15% and 18%

SURFACE AND INTERFACE ANALYSIS

Kormos, L; Kratzer, M; Kostecki, K; Oehme, M; Sikola, T; Kasper, E; Schulze, J; Teichert, C, 2017: Surface analysis of epitaxially grown GeSn alloys with Sn contents between 15% and 18%. SURFACE AND INTERFACE ANALYSIS 49(4), p. 297 - 302, doi: 10.1002/sia.6134

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