X-ray micro-CT measurement of large parts at very low temperature

REVIEW OF SCIENTIFIC INSTRUMENTS

Koutecky, T; Zikmund, T; Glittova, D; Palousek, D; Zivcak, J; Kaiser, J, 2017: X-ray micro-CT measurement of large parts at very low temperature. REVIEW OF SCIENTIFIC INSTRUMENTS 88(3), p. 033707-1 - 033707-6, doi: 10.1063/1.4979077

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