X-ray Photoelectron Spectroscopy Axis Supra (KRATOS-XPS)

CONTACT US

Guarantor: Josef Polčák, Ph.D.
Instrument status: Operational Operational, 10.8.2026 12:01, Loaned X-ray control unit installed. Original unit is to be sent for repair.
Equipment placement: CEITEC Nano - C1.38
Research group: CF: CEITEC Nano


Description:

AXIS SupraTM is an X-ray photoelectron spectrometer (XPS) with unrivalled automation and ease of use for materials surface characterisation. The patented AXIS technology ensures high electron collection efficiency in spectroscopy mode and low aberrations at high magnifications in parallel imaging mode.


Publications:

  • Zelenák, F.; Buchlová, T.; Zažímal, F.; Sihelník, S.; Vrána, L.; Kováčik, D.; Gemeiner, P.; Krumpolec, R., 2026: . APPLIED SURFACE SCIENCE 715, doi: 10.1016/j.apsusc.2025.164566; FULL TEXT
    (FTIR, RIGAKU9, KRATOS-XPS)
  • Floreková, J.; Pokorný, T.; Ashtiani, S.; Jansen, J. C.; Fuoco, A.; Longo, M.; Schneider, J.; Průša, F.; Friess, K., 2026: . SEPARATION AND PURIFICATION TECHNOLOGY 380, doi: 10.1016/j.seppur.2025.135107; FULL TEXT
    (KRATOS-XPS)
  • FAWAEER, S.; AL-QAISI, W.; SEDLÁKOVÁ, V.; MOUSA, M.; KNÁPEK, A.; SOBOLA, D., 2026: Non-epitaxial integration of strain-tuned polycrystalline BiFeO3 thin films for silicon-based optoelectronics. OPTICAL MATERIALS 169, doi: 10.1016/j.optmat.2025.117577; FULL TEXT
    (RIGAKU3, VERIOS, ICON-SPM, WOOLLAM-VIS, MAGNETRON, KRATOS-XPS)
  • Pokorny, T.; Zhu, R.; Simonikova, L.; Styskalik, A.; Román‐Leshkov, Y.; Skoda, D., 2026: . JOURNAL OF THE AMERICAN CERAMIC SOCIETY 109(1), doi: 10.1111/jace.70339; FULL TEXT
    (KRATOS-XPS)
  • JU, X.; VELLUVAKANDY, R.; WU, X.; MERLOS RODRIGO, M.; HEGER, Z.; BENDICKOVA, K.; FRIC, J.; PUMERA, M., 2026: Liquid Metal Microrobots for Magnetically Guided Transvascular Navigation. ADVANCED MATERIALS 18382, doi: 10.1002/adma.202518382; FULL TEXT
    (MIRA-STAN, LYRA, RIGAKU3, VERSALAB, KRATOS-XPS)

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