Graphics cards based topography artefacts simulations in Scanning Thermal Microscopy

INTERNATIONAL JOURNAL OF HEAT AND MASS TRANSFER

Klapetek, P; Martinek, J; Grolich, P; Valtr, M; Kaur, NJ, 2017: Graphics cards based topography artefacts simulations in Scanning Thermal Microscopy. INTERNATIONAL JOURNAL OF HEAT AND MASS TRANSFER 108, p. 841 - 850, doi: 10.1016/j.ijheatmasstransfer.2016.12.036

Research Groups:

• Development of Methods for Analysis and Measuring - Petr Klapetek
• CF: CEITEC Nano

CEITEC authors:

• Petr Klapetek, Ph.D.
• Miroslav Valtr, Ph.D.
• Nupinder Jeet Kaur