Imaging of near-field interference patterns by aperture-type SNOM - influence of illumination wavelength and polarization state

OPTICS EXPRESS

Dvorak, P; Edes, Z; Kvapil, M; Samoril, T; Ligmajer, F; Hrton, M; Kalousek, R; Krapek, V; Dub, P; Spousta, J; Varga, P; Sikola, T, 2017: Imaging of near-field interference patterns by aperture-type SNOM - influence of illumination wavelength and polarization state. OPTICS EXPRESS 25(14), p. 16560 - 16573, doi: 10.1364/OE.25.016560

Equipment:

Research Groups:

CEITEC authors: