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Methods for topography artifacts compensation in scanning thermal microscopy

ULTRAMICROSCOPY

Martinek, J; Klapetek, P; Campbell, AC, 2015: Methods for topography artifacts compensation in scanning thermal microscopy. ULTRAMICROSCOPY 155, p. 55 - 61, doi: 10.1016/j.ultramic.2015.04.011

CEITEC authors:

• Petr Klapetek, Ph.D.