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Tip-sample relaxation as a source of uncertainty in nanoscale scanning probe microscopy measurements

MEASUREMENT SCIENCE & TECHNOLOGY

Campbellova, A; Klapetek, P; Valtr, M, 2009: Tip-sample relaxation as a source of uncertainty in nanoscale scanning probe microscopy measurements. MEASUREMENT SCIENCE & TECHNOLOGY 20(8)

CEITEC authors:

• Petr Klapetek, Ph.D.