Tip-sample relaxation as a source of uncertainty in nanoscale scanning probe microscopy measurements

MEASUREMENT SCIENCE & TECHNOLOGY

Campbellova, A; Klapetek, P; Valtr, M, 2009: Tip-sample relaxation as a source of uncertainty in nanoscale scanning probe microscopy measurements. MEASUREMENT SCIENCE & TECHNOLOGY 20(8)

Research Groups:

• Development of Methods for Analysis and Measuring - Petr Klapetek

CEITEC authors:

• Petr Klapetek, Ph.D.