Treatment of Surface Plasmon Resonance (SPR) Background in Total Internal Reflection Ellipsometry: Characterization of RNA Polymerase II Film Formation

APPLIED SPECTROSCOPY

Hemzal, D; Kang, YR; Dvorak, J; Kabzinski, T; Kubicek, K; Kim, YD; Humlicek, J, 2019: Treatment of Surface Plasmon Resonance (SPR) Background in Total Internal Reflection Ellipsometry: Characterization of RNA Polymerase II Film Formation. APPLIED SPECTROSCOPY 73(3), p. 261 - 270, doi: 10.1177/0003702819826280

Research Groups:

Structural Biology of Gene Regulation

CEITEC authors:

Karel Kubíček, Ph.D.
Jan Dvořák, Ph.D.