Uncertainty modeling in nanoscale scanning probe microscopy measurements of fullerene C-60

MEASUREMENT SCIENCE & TECHNOLOGY

Campbellova, A; Klapetek, P; Valtr, M, 2011: Uncertainty modeling in nanoscale scanning probe microscopy measurements of fullerene C-60. MEASUREMENT SCIENCE & TECHNOLOGY 22(3), doi: 10.1088/0957-0233/22/3/035106

Research Groups:

• Development of Methods for Analysis and Measuring - Petr Klapetek

CEITEC authors:

• Petr Klapetek, Ph.D.