Optical characterization of advanced nanomaterials with a high lateral resolution

Master´s Thesis

Liška, P., 2021: Optical characterization of advanced nanomaterials with a high lateral resolution. MASTER´S THESIS , p. 1 - 91; FULL TEXT
(NANOSAM, SNOM-NANONICS, ICON-SPM, LYRA, TITAN, VERIOS, WITEC-RAMAN, KRATOS-XPS, SIMS)

Equipment:

nanoScanning Auger Microscopy/ Scanning electron microscopy with polarization analysis Scienta Omicron nanoSAM Lab
Scanning Near-field Optical Microscopy Nanonics Imaging MV 4000
Scanning Probe Microscope Bruker Dimension Icon
Focused Ion Beam/Scanning Electron Microscope TESCAN LYRA3
High-resolution (scanning) Transmission Electron Microscope FEI Titan Themis 60-300 cubed
High resolution Scanning Electron Microscope FEI Verios 460L
Witec Alpha 300R
X-ray Photoelectron Spectroscopy Axis Supra
Secondary Ion Mass Spectroscopy ION-TOF TOF.SIMS5

Research Groups:

CF: CEITEC Nano

CEITEC authors:

Petr Liška